Publications
Affichage de 14531 à 14540 sur 16261
Transmission electron microscopy analysis of silicides used in ALSB-SOI MOSFET structures
J. Katcki, J. Ratajczak, A. Laszcz, F. Phillipp, Emmanuel Dubois, Guilhem Larrieu, Julien Penaud, Xavier Baie
Conference on Microscopy of Semiconducting Materials, Mar 2003, Cambridge, United Kingdom. pp.479-482, ⟨10.1201/9781351074636-110⟩. ⟨hal-00250182⟩
Accordabilité d'un circuit microonde par adjonction d'un substrat cristal liquide
Nicolas Tentillier, Bertrand Splingart, Erick Paleczny, Jean-François Legier, Christian Legrand
Treizièmes Journées Nationales Micro-ondes (JNM 2003), May 2003, Lille, France. pp.3D-4. ⟨hal-00146562⟩
Actionneurs films minces pour contrôle santé de structures
E. Fribourg-Blanc, M. Dupont, D. Osmont, Eric Cattan, Denis Remiens
Instrumentation, Mesure, Métrologie, 2003, 3, pp.225-237. ⟨hal-00146476⟩
Comparative measurements of the optical spectrum dependence on distance between laterally coupled diode lasers
H. Lamela, R. Santos, G. Carpintero, Jean-Pierre Vilcot, A. Barsella, J. Figueiredo, M. Pessa
2003, pp.86-91. ⟨hal-00146495⟩
Novel dual-mode laser structures
S. Garidel, Jean-Pierre Vilcot, Didier Decoster, M. Francois, M. Muller
Semiconductor and Integrated Optoelectronics, SIOE 2003, 2003, Cardiff, Wales, United Kingdom. ⟨hal-00146584⟩
Integrated InP optical switches based on carrier-induced index variation
Hongwu Li, Karine Blary, Samuel Dupont, Jean-Pierre Vilcot, Joseph Harari, Jean Chazelas, Didier Decoster
Microwave and Optical Technology, Aug 2003, Ostrava, Czech Republic. ⟨10.1117/12.558773⟩. ⟨hal-00146591⟩
Optical properties of hexagonal boron nitride thin layers
A. Soltani, H. Bakhtiar, P. Thévenin, A. Bath
Jurnal Fizik UTM, 2003, 9, pp.17-25. ⟨hal-00146670⟩
High frequency noise sources extraction in nanometrique MOSFETs
Francois Danneville, G. Pailloncy, Gilles Dambrine
NATO Advanced Research Workshop, Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices, 2003, Brno, Czech Republic. ⟨hal-00146038⟩
Nondestructive defects detection inside dielectric materials by microwave techniques
M. Maazi, D. Glay, T. Lasri
2003, pp.Session 3A. ⟨hal-00146044⟩