Publications

• Article dans une revue

Sol-gel derived thin films on GaAs

S. Arscott, N Smith, R Kurchania, S Milne, R Miles

Semiconductor Science and Technology, 1998, 13 (2), pp.244-248. ⟨10.1088/0268-1242/13/2/016⟩. ⟨hal-02348109⟩

• Article dans une revue

Hot-carrier injections in SiO2

Dominique Vuillaume, Alain Bravaix, D Goguenheim

We review the hot-carrier injection phenomena in gate-oxide and the related degradation in silicon MOSFETs. We discuss the basic degradation mechanisms and the nature of the created defects by carrier injections through the gate-oxide. Emphasis is put on the discussion of dynamic hot-carrier…

Microelectronics Reliability, 1998, Microelectronics Reliability, 38 (1), pp.7-22. ⟨10.1016/S0026-2714(97)00179-0⟩. ⟨hal-03674471⟩

• Article dans une revue

Giant electronic stop bands in one-dimensional comblike structures

Jerome O. Vasseur, Abdellatif Akjouj, L. Dobrzynski, Bahram Djafari-Rouhani, J. Vasseur, M. Kushwaha

EPL - Europhysics Letters, 1998, 41 (3), pp.321-326. ⟨10.1209/epl/i1998-00150-y⟩. ⟨hal-03301311⟩

• Article dans une revue

Influence of inhomogeneous strain relaxation on the photoluminescence of II-VI nanostructures

Y.M. Niquet, Cécile Gourgon, L.S. Dang, H. Mariette, Catherine Priester, Christophe Vieu, G. Brunthaler, H. Straub, A. Darhuber, W. Faschinger, G. Bauer

Journal of Crystal Growth, 1998, 184, pp.334-338. ⟨hal-04143190⟩

• Communication dans un congrès

Study of the Ti/Al/Ni/Au ohmic contact on n-GaN for high temperature applications

S. Trassaert, B. Boudart, Xavier Wallart, Didier Theron, Y. Crosnier

8th European Workshop on Heterostructure Technology (HETECH), 1998, Cardiff, United Kingdom. ⟨hal-01654296⟩

• Article dans une revue

Noise modeling in MESFET and HEMT mixers using a uniform noisy line model

Francois Danneville, Gilles Dambrine, A. Cappy

IEEE Transactions on Electron Devices, 1998, 45 (10), pp.2207-2212. ⟨10.1109/16.725255⟩. ⟨hal-03612813⟩

• Article dans une revue

A new extrinsic equivalent circuit of HEMT's including noise for millimeter-wave circuit design

Gilles Dambrine, J.-M. Belquin, Francois Danneville, A. Cappy

IEEE Transactions on Microwave Theory and Techniques, 1998, 46 (9), pp.1231-1236. ⟨10.1109/22.709461⟩. ⟨hal-03612815⟩

• Article dans une revue

Surface spinodal decomposition in low temperature Al0.48In0.52As grown on InP(001) by molecular beam epitaxy

G. Grenet, Michel Gendry, M. Oustric, Y. Robach, L. Porte, G. Hollinger, O. Marty, M. Pitaval, C. Priester

The clustering development for lattice-matched A104s ln0.52 As grown on (001) oriented InP substrates by molecular beam epitaxy (MBE) has been investigated by ex-situ transmission electron microscopy (TEM) and in-situ scanning tunnelling microscopy (STM). For a growth temperature of 450°C, a V/III…

Applied Surface Science, 1998, 123, pp.324 - 328. ⟨10.1016/S0169-4332(97)00522-9⟩. ⟨hal-02194425⟩

• Article dans une revue

An Accurate Dual-Gate HFET Nonlinear Model for Millimeter-Wave MMIC Design

Rachid Allam, Christophe Kolanowski, J. C. De Jaeger, Y. Crosnier

An accurate nonlinear model for dual-gate HFETs is presented in this paper. Because of the complexity of the global equivalent circuit, the dual-gate transistor is modeled as two single-gate devices in cascode configuration. A good agreement between the measured and simulated performance is…

International Journal of Microwave and Millimeter-Wave Computer-Aided Engineering, 1998, 1998 (4), pp.315--320. ⟨10.1002/(SICI)1099-047X(199807)8:43.0.CO;2-E⟩. ⟨hal-03360875⟩

• Article dans une revue

Noise analysis of 0.1 mm gate MESFETs and HEMTs

Javier Mateos, Tomas Gonzalez, Daniel Pardo, Patrick Tadyszak, Francois Danneville, A. Cappy

Solid-State Electronics, 1998, 42 (1), pp.79-85. ⟨10.1016/S0038-1101(97)00196-2⟩. ⟨hal-03612836⟩