Publications

Affichage de 7431 à 7440 sur 16545


  • Communication dans un congrès

Mesure des coefficients de réflexion et de transmission de panneaux en cuve acoustique - Etude comparative de différentes méthodes

Christian Granger, C. Audoly

12ème Congrès Français d'Acoustique, CFA 2014, 2014, Poitiers, France. ⟨hal-00978399⟩

  • Communication dans un congrès

Near-field microscopy : from MIR to THz

Gabriel Moreno, Antoine Pagies, Damien Ducatteau, Nicolas Clément, Tahsin Akalin, Mathias Vanwolleghem, Jean-Francois Lampin

joint 25th Conference of the Condensed Matter Division of the European Physical Society, and 14èmes Journées de la Matière Condensée, CMD25-JMC14, 2014, Paris, France. 2 p. ⟨hal-01015277⟩

  • Communication dans un congrès

Room-temperature quantum spin Hall effect in HgTe honeycomb superlattices

Cristiane Morais Smith, Wouter Beugeling, Efterpi Kalesaki, Yann-Michel Niquet, Christophe Delerue, Daniel Vanmaekelbergh

The recent experimental realization of self-assembled honeycomb superlattices of truncated semiconducting nanocrystals has opened a new path to engineer graphene-like structures. Atomistic band-structure calculations for honeycomb lattices of PbSe and CdSe have shown a rich band structure, with…

American Physical Society March Meeting, APS March Meeting 2014, Session B31 - Focus Session : Computational Discovery and Design of New Materials II, 2014, Denver, CO, United States. ⟨hal-00922589⟩

  • Communication dans un congrès

OFDM PLC transmission for aircraft flight control system

Thomas Larhzaoui, Fabienne Nouvel, Jean-Yves Baudais, Pierre Degauque, Virginie Degardin

18th IEEE International Symposium on Power Line Communications and its Applications, ISPLC 2014, 2014, Glasgow, Scotland, United Kingdom. pp.220-225, ⟨10.1109/ISPLC.2014.6812333⟩. ⟨hal-00992666⟩

  • Communication dans un congrès

1-20 GHz k Omega-range BiCMOS 55 nm Reflectometer

Pietro M. Ferreira, Cora Donche, Kamel Haddadi, Tuami Lasri, Gilles Dambrine, Christophe Gaquière, Thomas Quemerais, Daniel Gloria

Scanning microwave microscope (SMM) combines the high spatial resolution with the high-sensitivity electric measurement capabilities of a vector network analyzer (VNA). SMM has been pointed out as very well suited for nanodevices characterization. In recent publications, SMM has demonstrated high…

12th IEEE International New Circuits and Systems Conference (IEEE NEWCAS), Jun 2014, Trois-Rivieres, Canada. pp.385-388. ⟨hal-03224670⟩