Publications
Affichage de 14421 à 14430 sur 16260
The use of permanently-mounted surface transducers to characterize Lamb wave propagation
Laurent Duquenne, Faysal El Youbi, Emmanuel Moulin, Sébastien Grondel, Jamal Assaad, Christophe Delebarre
WCU 2003, Sep 2003, Paris, France. pp.6001-6004. ⟨hal-00147113⟩
Numerical analysis of the process induced stresses in silicon microstructures
V. Senez, T. Hoffmann, A. Armigliato, I. de Wolf
2003, pp.350-361. ⟨hal-00146444⟩
Réalisation d'un banc de mesure d'intermodulation biton en bande Ka : application à l'analyse des causes technologiques de non-linéarité des HEMTs de puissance
Frédéric Bue-Erkmen
2003. ⟨hal-00146643⟩
Management thermique des transistors HEMT AlGaN/GaN
Raphaël Aubry, N. Caillas, C. Dua, H. Gerard, B. Dessertene, Marie-Antoinette Di Forte-Poisson, Yvon Cordier, Didier Floriot, Jean-Claude de Jaeger, Sylvain Laurent Delage
GDR Grand Gap, 2003, Nice, France. ⟨hal-00146694⟩
HEMT métamorphique pour applications de puissance en bande V : influence de la couche de barrière
B. Bonte, M. Ardouin, M. Zaknoune, D. Theron, Y. Cordier, S. Bollaert, Jean-Claude de Jaeger
2003, pp.4A2-2. ⟨hal-00146696⟩
Optimisation des performances du transistor HEMT AlGaN/GaN sur substrat Si
A. Minko, Virginie Hoel, D. Theron, Jean-Claude de Jaeger, Y. Cordier, F. Semond, F. Natali, J. Massies
GDR Grand Gap, 2003, Nice, France. ⟨hal-00146717⟩
Electric force microscopy of individually charged semiconductor nanoparticles on conductive substrates : quantitative charge measurements and dipole-dipole interactions
Thierry Melin, H. Diesinger, D. Deresmes, D. Stiévenard
12th International Conference on Scanning Tunneling Microscopy, Spectroscopy and Related Techniques, STM'03, 2003, Eindhoven, Netherlands. ⟨hal-00146614⟩
The effect of quantum confinement on the optical properties of semiconductor nanocrystals
Christophe Delerue, Guy Allan
Materials Research Society Fall Meeting, 2003, Boston, MA, United States. ⟨hal-00146644⟩
Low frequency drain noise comparison of AlGaN/GaN HEMTs grown on silicon, SiC and sapphire substrates
A. Curutchet, N. Malbert, N. Touboul, Christophe Gaquière, A. Minko, M. Uren
Microelectronics Reliability, 2003, 43, pp.1713-1718. ⟨hal-00146665⟩
Sommation optique de signaux hyperfréquences
N. Breuil, C. Fourdin, P. Nicole, G. Ulliac, Jean-Pierre Vilcot, J. Chazelas
2003, pp.6C-6. ⟨hal-00146559⟩