Publications
Affichage de 14891 à 14900 sur 16261
Wave dropping in multiport waveguide structures based on photonic crystals
O. Vanbésien, S. Fasquel, J. Danglot, X. Melique, D. Lippens
International Wokshop on Photonic and Electromagnetic Crystal Structures, PECS-IV, 2002, Los Angeles, CA, United States. ⟨hal-00148657⟩
Etude de la réactivité des surfaces d'alliages GaInAs (100) à un flux de phosphore
X. Wallart, C. Priester, D. Deresmes, F. Mollot
9èmes Journées Nationales Microélectronique et Optoélectronique, JNMO 2002, 2002, Saint Aygulf, France. ⟨hal-00148676⟩
Evaluation de la dégradation des ouvrages en béton par ondes ultrasonores haute fréquence
S. Ould Naffa, M. Goueygou, Bogdan Piwakowski, F. Buyle-Bodin
Actes du 6ème Congrès Français d'Acoustique, CFA 2002, 2002, Lille, France. ⟨hal-00250221⟩
Critical angular dependance of the polarising field on the magnetoelastic dynamics near the SRT in TbFe/FeCo multilayers
Nicolas Tiercelin, Vladimir Preobrazhensky, Jamal Ben Youssef, Philippe Pernod, Henri Le Gall
IEEE International Magnetics Conference, Intermag Europe 2002, Apr 2002, Amsterdam, Netherlands. pp.AS4, ⟨10.1109/INTMAG.2002.1000721⟩. ⟨hal-00250218⟩
Multiple parallel conduction paths observed in depth-profiled n-GaN epilayers
C. Mavroidis, J. Harris, R. Jackman, I. Harrison, B. Ansell, Z. Bougrioua, I. Moerman
Journal of Applied Physics, 2002, 91 (12), pp.9835. ⟨10.1063/1.1477604⟩. ⟨hal-02906594⟩
Fabrication of a pMUT using silicon bulk micromachining and a sputtered PZT layer
W. Daniau, Karim Dogheche, S. Ballandras, Eric Cattan, Denis Remiens, W. Steichen, P. Blind
Proc. of the 2nd WorkShop on MUT, Besançon, 2002, pp. june. ⟨hal-00123195⟩
Solid-state 8 GHz transient signal digitizer characterization
A. Ghis, P. Ouvrier-Buffet, N. Rolland, A. Benlarbi-Delai, P.A. Rolland, D. Glay, D. Jaeger
2002, pp.1673-1676. ⟨hal-00148329⟩
Fast electromagnetic characterization method of film-shaped materials using coplanar up to V-band
J. Hinojosa, K. Lmimouni, Gilles Dambrine
Electronics Letters, 2002, 38, pp.373-374. ⟨hal-00147838⟩
Measurement of the elastic and viscoelastic properties of dielectric films used in microelectronics
G. Carlotti, P. Colpani, D. Piccolo, S. Santucci, V. Senez, G. Socino, L. Verdini
Thin Solid Films, 2002, 414, pp.99-104. ⟨hal-00148744⟩
Vacuum and cryogenic station for Micro-Electro-Mechanical Systems probing and testing
Bernard Legrand, E. Quévy, B. Stefanelli, D. Collard, L. Buchaillot
Review of Scientific Instruments, 2002, 73, pp.4393-4395. ⟨hal-00148782⟩