Publications
Affichage de 10101 à 10110 sur 16457
Engineering sticky superomniphobic surfaces on transparent and flexible PDMS substrate
Renaud Dufour, Maxime Harnois, Yannick Coffinier, Vincent Thomy, Rabah Boukherroub, Vincent Senez
Langmuir, 2010, 26 (22), pp.17242-17247. ⟨10.1021/la103462z⟩. ⟨hal-00549492⟩
Fabrication of 24-MHz-disk resonators with silicon passive integration technology
M. Sworowski, F. Neuilly, Bernard Legrand, A. Summanwar, P. Philippe, L. Buchaillot
IEEE Electron Device Letters, 2010, 31, pp.23-25. ⟨10.1109/LED.2009.2034542⟩. ⟨hal-00548984⟩
Negative refraction of surface acoustic waves in the subgigahertz range
Bernard Bonello, Laurent Belliard, Juliette Pierre, Jerome O. Vasseur, Bernard Perrin, Olga Boyko-Kazymyrenko
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2010, 82, pp.104109-1-5. ⟨10.1103/PhysRevB.82.104109⟩. ⟨hal-00549435⟩
Bottom and top electrodes nature and PZT film thickness influence on electrical properties
N. Sama, Caroline Soyer, Denis Remiens, C. Verrue, R. Bouregba
Sensors and Actuators A: Physical , 2010, 158, pp.99-105. ⟨10.1016/j.sna.2009.11.032⟩. ⟨hal-00549503⟩
Growth and electric properties of MPB BiScO3-PbTiO3 thin films on La0.7Sr0.3MnO3-coated silicon substrates
S.A. Zhang, X.L. Dong, Y. Chen, F. Cao, Y.Y. Zhang, G.S. Wang, N. Sama, Denis Remiens
Journal of the American Ceramic Society, 2010, 93, pp.1583-1585. ⟨10.1111/j.1551-2916.2010.03630.x⟩. ⟨hal-00549506⟩
Time-resolved charge detection and back-action in quantum circuits
T. Ihn, S. Gustavsson, U. Gasser, R. Leturcq, I. Shorubalko, K. Ensslin
Physica E: Low-dimensional Systems and Nanostructures, 2010, 42, pp.803-808. ⟨10.1016/j.physe.2009.11.087⟩. ⟨hal-00568568⟩
Vers la caractérisation cellulaire par BioMEMS THz
Simon Laurette, A. Treizebre, Nour Eddine Bourzgui, Bertrand Bocquet
13èmes Journées Nationales du Réseau Doctoral en Microélectronique, JNRDM 2010, Jan 2010, Paris, France. CD-ROM, Session MEMS Lab-on-chip, 1-4. ⟨hal-00573235⟩
Parasitic effects and traps in AlGaN/GaN HEMT on sapphire substrate
O. Fathallah, M. Gassoumi, B. Grimbert, Christophe Gaquière, H. Maaref
European Physical Journal: Applied Physics, 2010, 51, pp.10304-1-5. ⟨10.1051/epjap/2010085⟩. ⟨hal-00549476⟩
Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications
J. Ratajczak, A. Laszcz, A. Czerwinski, J. Katcki, F. Phillipp, P.A. van Aken, N. Reckinger, Emmanuel Dubois
Journal of Microscopy, 2010, EM 2008 ‐ XIII International Conference on Electron Microscopy, 237 (3), pp.379-383. ⟨10.1111/j.1365-2818.2009.03264.x⟩. ⟨hal-00549623⟩
Imperfection-sensitive ductility of aluminium thin films
M. Coulombier, A. Boé, C. Brugger, J.P. Raskin, T. Pardoen
Scripta Materialia, 2010, 62, pp.742-745. ⟨10.1016/j.scriptamat.2010.01.048⟩. ⟨hal-00548611⟩