Publications

Affichage de 7291 à 7300 sur 16455


  • Autre publication scientifique

Advances in Historical Studies [Editor in Chief 3/4]

Raffaele Pisano

2014. ⟨hal-04511044⟩

  • Communication dans un congrès

Mesure des coefficients de réflexion et de transmission de panneaux en cuve acoustique - Etude comparative de différentes méthodes

Christian Granger, C. Audoly

12ème Congrès Français d'Acoustique, CFA 2014, 2014, Poitiers, France. ⟨hal-00978399⟩

  • Communication dans un congrès

Near-field microscopy : from MIR to THz

Gabriel Moreno, Antoine Pagies, Damien Ducatteau, Nicolas Clément, Tahsin Akalin, Mathias Vanwolleghem, Jean-Francois Lampin

joint 25th Conference of the Condensed Matter Division of the European Physical Society, and 14èmes Journées de la Matière Condensée, CMD25-JMC14, 2014, Paris, France. 2 p. ⟨hal-01015277⟩

  • Communication dans un congrès

OFDM PLC transmission for aircraft flight control system

Thomas Larhzaoui, Fabienne Nouvel, Jean-Yves Baudais, Pierre Degauque, Virginie Degardin

18th IEEE International Symposium on Power Line Communications and its Applications, ISPLC 2014, 2014, Glasgow, Scotland, United Kingdom. pp.220-225, ⟨10.1109/ISPLC.2014.6812333⟩. ⟨hal-00992666⟩

  • Article dans une revue

F center in lithium fluoride revisited : comparison of solid-state physics and quantum-chemistry approaches

Ferenc Karsai, Paul Tiwald, Robert Laskowski, Fabien Tran, David Koller, Stefanie Gräfe, Joachim Burgdörfer, Ludger Wirtz, Peter Blaha

We revisit the theoretical description of the F color center in lithium fluoride employing advanced complementary ab initio techniques. We compare the results from periodic supercell calculations involving density-functional theory (DFT) and post-DFT techniques with those from the embedded-cluster…

Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2014, 89, 125429, 12 p. ⟨10.1103/PhysRevB.89.125429⟩. ⟨hal-00968483⟩

  • Communication dans un congrès

1-20 GHz k Omega-range BiCMOS 55 nm Reflectometer

Pietro M. Ferreira, Cora Donche, Kamel Haddadi, Tuami Lasri, Gilles Dambrine, Christophe Gaquière, Thomas Quemerais, Daniel Gloria

Scanning microwave microscope (SMM) combines the high spatial resolution with the high-sensitivity electric measurement capabilities of a vector network analyzer (VNA). SMM has been pointed out as very well suited for nanodevices characterization. In recent publications, SMM has demonstrated high…

12th IEEE International New Circuits and Systems Conference (IEEE NEWCAS), Jun 2014, Trois-Rivieres, Canada. pp.385-388. ⟨hal-03224670⟩