Publications

Affichage de 7911 à 7920 sur 16456


  • Article dans une revue

A robust thermal microstructure for mass flow rate measurement in steady and unsteady flows

R. Viard, Abdelkrim Talbi, A. Merlen, Philippe Pernod, C. Frankiewicz, J.C. Gerbedoen, Vladimir Preobrazhensky

Journal of Micromechanics and Microengineering, 2013, 23, pp.065016-1-8. ⟨10.1088/0960-1317/23/6/065016⟩. ⟨hal-00821233⟩

  • Communication dans un congrès

Sheet resistance of multi-layer stacking of silicene

Pierre Capiod, Maxime Berthe, Andrea Resta, Paola de Padova, Patrick Vogt, Guy Le Lay, B. Grandidier

European Materials Research Society Spring Meeting, E-MRS Spring 2013, Symposium I - The route to post-Si CMOS devices : from high mobility channels to graphene-like 2D nanosheets, 2013, Strasbourg, France. ⟨hal-00819685⟩

  • Communication dans un congrès

Geometry optimization for sub-THz Gunn emission : a V-shape GaN nanodevice

I. Iniguez-De-La-Torre, J.F. Millithaler, A. Iniguez-De-La-Torre, J. Mateos, P. Sangare, Guillaume Ducournau, Christophe Gaquière, T. Gonzales

18th International Conference on Electron Dynamics in Semiconductors, Optoelectronics and Nanostructures, EDISON18, 2013, Matsue, Japan. ⟨hal-00823433⟩

  • Article dans une revue

Establishment of a derivatization method to quantify thiol function in sulfur-containing plasma polymer films

D. Thiry, R. Francq, D. Cossement, David Guérin, D. Vuillaume, R. Snyders

Langmuir, 2013, 29, pp.13183-13189. ⟨10.1021/la402891t⟩. ⟨hal-00903758⟩

  • Communication dans un congrès

Conducting IPNs based self-standing and ultrathin microactuators operating in air

Ali Maziz, Cedric Plesse, C. Chevrot, D. Teyssie, Caroline Soyer, Eric Cattan, F. Vidal

7th World Congress on Biomimetics, Artificial Muscles and Nano-Bio, BAMN 2013, 2013, Jeju Island, South Korea. ⟨hal-00908687⟩

  • Communication dans un congrès

Nanoscale capacitors study with an interferometric scanning microwave microscope

Fei Wang, Nicolas Clément, David Troadec, Bernard Legrand, Gilles Dambrine, Didier Theron

Electrical impedance characterization at the nanoscale is a challenge for beyond CMOS investigations and for understanding the electronic properties of nanomaterials. Among the various scanning probe microscopes, Scanning Microwave Microscope (SMM) is of particular interest because it combines…

Materials Research Society Fall Meeting, MRS Fall 2013, Symposium LL : Advances in Scanning Probe Microscopy, 2013, Boston, MA, United States. ⟨hal-00944017⟩