Publications
Affichage de 12921 à 12930 sur 16303
Damaging process determination
L. Buchaillot, O. Millet
Symposium on Mechanical Reliability of Silicon MEMS – Recent progress and further requirements, 2006, Halle Saale, Germany. ⟨hal-00128690⟩
Finite size effects and dynamical properties of mesoscopic ferroelectrics
Laurent Baudry
8th European Conference on Applications of Polar Dielectrics, 2006, Metz, France. ⟨hal-00128181⟩
Parallel-plate electrostatic actuators in liquids : displacement-voltage optimisation for microfluidic applications
Bernard Legrand, A.S. Rollier, L. Buchaillot, D. Collard
2006, pp.718-721. ⟨hal-00128668⟩
Ultra-low voltage MEMS resonator based on RSG-MOSFET
N. Abele, K. Segueni, K. Boucart, F. Casset, Bernard Legrand, L. Buchaillot, P. Ancey, A.M. Ionescu
2006, pp.882-885. ⟨hal-00128669⟩
Spectral characterisation of monolithic modelocked lasers for mm-wave generation and signal processing
P. Acedo, H. Lamela, S. Garidel, C. Roda, Jean-Pierre Vilcot, G. Carpintero, I.H. White, K.A. Williams, M. Thompson, W. Li, M. Pessa, M. Dumitrescu, S. Hansmann
Electronics Letters, 2006, 42, pp.928-929. ⟨hal-00154943⟩
Feasibility of contact-less temperature control by microwave radiometry during sintering of powdered SiC and Al/SiC samples
C. Ricard, Luc Dubois, S. Vaucher, S. Leparoux, J.C. Camart, J. Pribetich
Microwave and Optical Technology Letters, 2006, 48, pp.2037-2041. ⟨hal-00154923⟩
Propriétés élastiques de réseaux de nanostructures sondées par acoustique picoseconde. Sélection de modes en longueur d'onde
J.F. Robillard, Arnaud Devos, I. Roch-Jeune
10èmes Journées de la Matière Condensée, JMC10, 2006, Toulouse, France. ⟨hal-00126496⟩
Experimental verification of left-handed characteristics of split ring resonators and wires array in finline
A. Marteau, Eric Lheurette, T. Decoopman, X. Melique, O. Vanbesien, D. Lippens
EuMA - Journal of the European Microwave Association, 2006, 2, pp.38-43. ⟨hal-00126830⟩
Broadband nulling interferometry for weak multipath signal detection
A. Benlarbi-Delaï, Michael Bocquet, Christophe Loyez
Electronics Letters, 2006, 42, pp.435-436. ⟨hal-00126794⟩
Influence of gate offset spacer width on SOI MOSFETs HF properties
R. Valentin, A. Siligaris, G. Pailloncy, Emmanuel Dubois, Gilles Dambrine, Francois Danneville
2006, pp.77-80. ⟨hal-00126800⟩