Publications
Affichage de 15331 à 15340 sur 16126
Strain induced optical anisotropy in self-organized quantum structures at the E1 transition
A. Prieto, G. Garmelles, C. Priester, J.M. Garcia, L. Gonzalez, R. Garcia
Applied Physics Letters, 2000, 76, pp.2197-2199. ⟨hal-00158659⟩
Lithium insertion in SnS2
I. Lefebvre, J. Olivier-Fourcade, J.C. Jumas, P. Lavela
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2000, 61, pp.3110-3116. ⟨hal-00158662⟩
Strain mapping of V-groove InGaAs/GaAs strained quantum wires using cross sectional Atomic Force Microscopy
F. Lelarge, C. Priester, C. Constantin, A. Rudra, K. Leifer, E. Kapon
Applied Surface Science, 2000, 166, pp.290-294. ⟨hal-00158661⟩
Wideband compact antenna for K-band applications
Marjorie Grzeskowiak, Philippe Descamps, Jean Vindevoghel
Electronics Letters, 2000, 36 (1), pp.5-7. ⟨10.1049/el:20000012⟩. ⟨hal-02166742⟩
Kinetics of oxydation by scanning probe microscopy : a space-charge-limited model
Emmanuel Dubois, J.L. Bubendorff
Journal of Applied Physics, 2000, 87, pp.8148-8154. ⟨10.1063/1.373510⟩. ⟨hal-00158510⟩
Technology progress for a large variety of polymers
J.F. Larchanche, B. Bellini, Jean-Pierre Vilcot, Didier Decoster
2000, pp.27-30. ⟨hal-00158598⟩
Rugged infrared sensors for use in safety-related industrial environnement
Abel Ebongue, Franck Brachelet, Frédéric Polet, Bruno Bêche, Etienne Gaviot
Proceeding of the 6th International Workshop on thermal investigations of Ics and Systems, 2000, Budapest, Hungary. ⟨hal-01554375⟩
Réalisation technologique d'un transistor à effet de champ dans la filière GaN
B. Boudart
Ecole Thématique sur les Nitrures d'Elemants III, 2000, Orcières-Merlette, France. ⟨hal-00159050⟩
Intermodulation load pull measurement in the 26-40 GHz bandwidth
Christophe Gaquière, Frédéric Bue-Erkmen, Pascal Delemotte, Yves Crosnier
30th European Microwave Week, 2000, Paris, France. ⟨hal-00159051⟩
InAs dots grown by MBE on InAIAs and InGaAs lattice mismatched buffers on GaAs
Y. Cordier, D. Ferre, P. Miska
Proceedings of the 42nd Electronic Materials Conference, Jun 2000, Denver, CO, United States. ⟨hal-00158219⟩