Publications
Affichage de 14671 à 14680 sur 16556
Accurate modelling of large angle tilt (LATID) and pure vertical implantations : application to the simulation of n- and p-LDMOS backgates
Evelyne Lampin, Emmanuel Dubois, H. Xu, S. Bardy, F. Murray
IEEE Transactions on Electron Devices, 2003, 50 (5), pp.1401-1404. ⟨10.1109/TED.2003.813464⟩. ⟨hal-00146392⟩
Strain determination in silicon microstructures by combined TEM/CBED, process simulation and micro-Raman spectroscopy
V. Senez, A. Armigliato, I. de Wolf, G. Carnevale, R. Balboni, S. Frabboni, A. Benedetti
Journal of Applied Physics, 2003, 94 (9), pp.5574-5583. ⟨10.1063/1.1611287⟩. ⟨hal-00146408⟩
Lead Zirconate Titanate (PZT) Films Deposited by a Hydrothermal Method
Sébastien Euphrasie, Sylvie Daviero-Minaud, Philippe Pernod
Solid State Sciences, 2003, 5 (11-12), pp.1499-1504. ⟨10.1016/j.solidstatesciences.2003.10.002⟩. ⟨hal-00258427⟩
Self-assembled molecular rectifying diodes
S. Lenfant, D. Vuillaume, Christophe Krzeminski, C. Delerue
Materials Research Society Spring Meeting, 2003, San Francisco, CA, United States. ⟨hal-00146173⟩
Assessment of deteriorated concrete cover
F. Buyle-Bodin, Bogdan Piwakowski, A. Fnine, M. Goueygou, S. Ould-Naffa
Proceedings of the 2003 Workshop on Nondestructive Testing of Materials, Structures and Textures, NTM'03, 2003, Warsaw, Poland. ⟨hal-00250184⟩
Polynomial method applied to acoustic waves in inhomogeneous cylinders
L. Elmaimouni, Jean-Etienne Lefebvre, Tadeusz Gryba, V. Zhang
2003, pp.1400-1403. ⟨hal-00145983⟩
Impact of down scaling on high frequency noise performance of bulk and SOI MOSFETs
Gilles Dambrine, C. Raynaud, M. Vanmackelberg, Francois Danneville, G. Pailloncy, Sylvie Lepilliet, J.P. Raskin
SPIE Fluctuations and Noise Symposium, Noise in Devices and Circuits, 2003, Sante Fe, NM, United States. ⟨hal-00146001⟩
An electromechanical ring lead zirconate titanate (PZT) actuator used as a spring
J.C. Debus, M. Lippert, Anne-Christine Hladky, M. Brussieux
2003 US Navy Workshop on Acoustic Transduction Materials and Devices, 2003, State College, PA, United States. ⟨hal-00145965⟩
What are the limiting parameters of deep-submicron MOSFETs for high frequency applications ?
Gilles Dambrine, C. Raynaud, D. Lederer, M. Dehan, O. Rozeaux, M. Vanmackelberg, Francois Danneville, Sylvie Lepilliet, J.P. Raskin
IEEE Electron Device Letters, 2003, 24, pp.189-191. ⟨hal-00145984⟩
Prediction of boron transient enhanced diffusion through the atom-by-atom modeling of extended defects
E. Lampin, Fuccio Cristiano, Y. Lamrani, Alain Claverie, B. Colombeau, N.E.B. Cowern
Journal of Applied Physics, 2003, 94 (12), pp.7520-7525. ⟨10.1063/1.1627461⟩. ⟨hal-00146393⟩