Publications
Affichage de 12721 à 12730 sur 16294
Molecular scale electronics in France
S. Lenfant, D. Vuillaume
Indo-French Chamber Commerce and Industry (IFCCI) and the Indo-French Technical Association (IFTA), 2006, Mumbai, India. ⟨hal-00127159⟩
Power measurement setup for large signal microwave characterization at 94 GHz
F Medjdoub, S. Vandenbrouck, Christophe Gaquière, E. Delos, M. Zaknoune, D. Theron
IEEE Electron Device Letters, 2006, 16, pp.218-220. ⟨hal-00127945⟩
Triple issues for triple junctions
F. Cleri
Metallphysikalisches Kolloquium am IMM (Institute of Physical Metallurgy and Metal Physics), 2006, Aachen, Germany. ⟨hal-00127949⟩
Photonic crystal lens : from negative refraction and negative index to negative permittivity and permeability
T. Decoopman, G. Tayeb, S. Enoch, D. Maystre, B. Gralak
Physical Review Letters, 2006, 97, pp.073905/1-4. ⟨hal-00127067⟩
Etat de contrainte de fins fils de silicium
A. Metsue, C. Priester
10èmes Journées de la Matière Condensée, 2006, Toulouse, France. ⟨hal-00127118⟩
Effets de contrainte sur la nucléation de boîtes quantiques de semiconducteurs sur substrat nanostructuré
C. Priester
10èmes Journées de la Matière Condensée, 2006, Toulouse, France. ⟨hal-00127065⟩
Conception et réalisation de transistors HEMT AlGaN/GaN avec différentes topologies fieldplate
J.C. Gerbedoen, Ali Soltani, Brahim Benbakhti, Jean-Claude de Jaeger
10èmes Journées de la Matière Condensée, Aug 2006, Toulouse, France. ⟨hal-00128164⟩
Surface polarization enhancement and switching properties of small ferroelectric particles
L. Baudry
Ferroelectrics, 2006, 333, pp.27-39. ⟨hal-00128183⟩
Left-handed electromagnetic properties of split-ring resonator and wire loaded transmission line in a fin-line technology
T. Decoopman, A. Marteau, Eric Lheurette, O. Vanbésien, D. Lippens
IEEE Transactions on Microwave Theory and Techniques, 2006, 54, pp.1451-1457. ⟨hal-00126831⟩
Analysis and modeling of substrate impedance network in RF CMOS
Emmanuel Bouhana, Patrick Scheerer, Samuel Boret, Daniel Gloria, Gilles Dambrine, Michel Minondo, Hervé Jaouen
IEEE International Conference on Microelectronic Test Structures, Mar 2006, Austin, TX, United States. pp.65-70, ⟨10.1109/ICMTS.2006.1614277⟩. ⟨hal-00126801⟩