Publications

• Communication dans un congrès

Etude par microscopie à champ proche de structures à base de matériaux III-N pour émetteurs électroniques planaires

Sophie Barbet, Raphaël Aubry, Marie-Antoinette Di Forte-Poisson, Thierry Melin, Didier Theron

10èmes Journées de la Matière Condensée, Aug 2006, Toulouse, France. ⟨hal-00127893⟩

• Article dans une revue

Electronic properties of organic monolayers and molecular devices

D. Vuillaume, S. Lenfant, David Guérin, C. Delerue, C. Petit, G. Salace

Pramana - Journal of Physics, 2006, 67, pp.17-32. ⟨hal-00127117⟩

• Communication dans un congrès

Propriétés de filtrage d'un stub couplé à un microguide

Yan Pennec, Abdellatif Akjouj, Bahram Djafari-Rouhani, Jerome O. Vasseur, L. Dobrzynski, J.P. Vigneron, Maxime Beaugeois

11èmes Journées Nano-Microélectronique et Optoélectronique, JNMO 2006, Apr 2006, Aussois, France. ⟨hal-00128168⟩

• Article dans une revue

Point-defect recombination efficiency at grain boundaries in irradiated SiC

A. Moriani, F. Cleri

Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2006, 73, pp.214113-1-9. ⟨hal-00127847⟩

• Article dans une revue

Multiexponential photoluminescence decay in indirect-gap semiconductor nanocrystals

Christophe Delerue, Guy Allan, Cécile Reynaud, Olivier Guillois, Gilles Ledoux, Friedrich Huisken

The origin of the multiexponential photoluminescence (PL) decay of Si quantum dots (QDs) has been debated for a long time. We present studies combining time-resolved PL experiments and tight binding calculations of phonon-assisted optical transitions showing that the distribution of lifetimes and…

Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2006, 73, pp.235318-1-4. ⟨10.1103/PhysRevB.73.235318⟩. ⟨hal-00127844⟩

• Article dans une revue

Electric force microscopy of individually charged semiconductor nanoparticles

Heinrich Diesinger, Thierry Melin, Sophie Barbet, D. Deresmes, Didier Stiévenard

Charge injection experiments by electrostatic force microscopy are performed on single semiconductor nanoparticles. Different methods of detecting the stored charge are used. Although the amount of charge stored in particles of realistic shape can be determined quantitatively, we present here a…

Physica Status Solidi A (applications and materials science), 2006, 203, pp.1344-1347. ⟨10.1002/pssa.200566162⟩. ⟨hal-00127830⟩

• Article dans une revue

Traps centers and deep defects contribution in current instabilities for AlGaN/GaN HEMT's on silicon and sapphire substrates

N. Sghaier, M. Trabelsi, N. Yacoubi, J.M. Bluet, A. Souifi, G. Guillot, Christophe Gaquière, Jean-Claude de Jaeger

Microelectronics Journal, 2006, 37, pp.363-370. ⟨hal-00127942⟩

• Article dans une revue

Influence of the deposition parameters on the texture of boron nitride thin films synthesized in a microwave plasma-enhanced reactor

P. Thévenin, M. Eliaoui, A. Ahaitouf, A. Soltani, A. Bath

Surface and Coatings Technology, 2006, 200, pp.6444-6448. ⟨hal-00127946⟩

• Article dans une revue

Nonlinear electrical properties of three-terminal junctions

D. Wallin, I. Shorubalko, H.Q. Xu, A. Cappy

Applied Physics Letters, 2006, 89, pp.092124-1-3. ⟨hal-00126525⟩

• Communication dans un congrès

Design, analysis and fabrication of high frequency piezoelectric transducers

Anne-Christine Hladky, J.C. Debus, Bertrand Dubus, F. Duval, C. Granger, P. Mosbah, Jamal Assaad, Sébastien Grondel, Eric Cattan, E.E. Newnham

Polecer International Conference, Piezoceramics for end-users II, 2006, Lillehammer, Norway. ⟨hal-00126491⟩