Publications
Affichage de 15801 à 15810 sur 16553
Comparison of microwave performances for fully and partially depleted sub-quarter micron SOI MOSFETs
M. Goffioul, Gilles Dambrine, D. Vanhoenacker, J.P. Raskin
Proceedings of the 5th Symposium on Diagnostics and Yield : SOI-Materials, Devices and Characterization, D&Y'2000, 2000, Warsaw, Poland. ⟨hal-00157893⟩
Stage de sensibilisation des étudiants au travail en salle blanche : réalisation d'éléments actifs et passifs
Virginie Hoel, H. Happy, P. Delemotte, Gilles Dambrine, A. Cappy
VIèmes Journées Pédagogiques du CNFM, 2000, Saint-Malo, France. ⟨hal-00157900⟩
Hétérostructures semiconductrices uni et bi-polaires : de la physique au composant
V. Duez
2000. ⟨hal-00158185⟩
Experimental evaluation of new thermal inversion approach in correlation microwave thermometry
S. Bri, L. Bellarbi, M. Habibi, M. Elkadiri, A. Mamouni
Electronics Letters, 2000, 36, pp.439-440. ⟨hal-00158129⟩
Dispositifs radiométriques pour usage industriel : réalisation et modélisation d'une nouvelle génération d'antenne capteur
C. Vanoverschelde
2000. ⟨hal-00158134⟩
Data transmission using an optical microwave link for wireless communications
P. Descamps, J. Vindevoghel, E. Vestiel, Jean-Pierre Vilcot
2000, pp.1261-1264. ⟨hal-00158142⟩
Theoretical and experimental study of multilayer structures using neural net classification methods
K. Harrouche, Jean-Michel Rouvaen, Mohammadi Ouaftouh, Mohamed Ourak, F. Haine
Measurement Science and Technology, 2000, 11, pp.285-290. ⟨hal-00159046⟩
Numerical modelling, experimental investigations, stress control for flat glass tempering
Dominique Lochegnies
Challenges and Breakthrough Technologies, 2000, Amsterdam, Netherlands. ⟨hal-00159082⟩
3-Dimensional process simulation of thermal annealing of low dose implanted dopants in silicon
V. Senez, J. Herbaux, T. Hoffmann, E. Lampin
IEICE Transactions on Electronics, 2000, E83-C, pp.1267-1274. ⟨hal-00158495⟩