Publications

• Article dans une revue

Temperature and frequency characterization of InAs nanowire and HfO2 interface using capacitance-voltage method

G. Astromskas, K. Storm, P. Caroff, M. Borgström, E. Lind, L.E. Wernersson

Microelectronic Engineering, 2011, 88, pp.444-447. ⟨10.1016/j.mee.2010.08.010⟩. ⟨hal-00592100⟩

• Article dans une revue

Mechanical characterization of aluminium nanofilms

Gregory Guisbiers, Etienne Herth, L. Buchaillot

The mechanical properties (Young’s modulus, hardness, wear resistance) of aluminium nanofilms on silicon substrate are studied. Size effect on these mechanical properties are exhibited. Young’s modulus, hardness and wear resistance increases when the thickness is reduced. Experimental…

Microelectronic Engineering, 2011, 88 (5), pp.844-847. ⟨10.1016/j.mee.2010.06.028⟩. ⟨hal-00579052⟩

• Article dans une revue

Characterizing nanoscale electromechanical fatigue in Pb(Mg1/3Nb2/3)O3-PbTiO3 thin films by piezoresponse force microscopy

A. Gatoux, A. Ferri, M. Detalle, Denis Remiens, R. Desfeux

Thin Solid Films, 2011, 520, pp.591-594. ⟨10.1016/j.tsf.2011.07.032⟩. ⟨hal-00639937⟩

• Article dans une revue

Evidence of surface charge effects in T-branch nanojunctions using microsecond-pulse testing

I. Iniguez-De-La-Torre, J. Mateos, Yannick Roelens, C. Gardes, S. Bollaert, T. Gonzalez

Nanotechnology, 2011, 22, pp.445203-1-5. ⟨10.1088/0957-4484/22/44/445203⟩. ⟨hal-00639808⟩

• Article dans une revue

Micro-patterning of LiPON and lithium iron phosphate material deposited onto silicon nanopillars array for lithium ion solid state 3D micro-battery

C. Lethien, Malek Zegaoui, Pascal Roussel, P. Tilmant, N. Rolland, Paul-Alain Rolland

The paper deals with the methodology used to form regular pattern of sputtered thin films LiPON/LiFePO4 material acting respectively as the solid electrolyte and the positive electrode of the lithium ion solid state 3D micro-battery. The micromachining of the silicon periodic nanopillars array (…

Microelectronic Engineering, 2011, 88 (10), pp.3172-3177. ⟨10.1016/j.mee.2011.06.022⟩. ⟨hal-00639805⟩

• Article dans une revue

Dielectric properties at microwaves frequencies of (Ni, Ti, La, Mg)-doped Ba0.3Sr0.7TiO3 thin films deposited on high-resistivity silicon substrates

Freddy Ponchel, Denis Remiens, J. Midy, Jean-François Legier, Caroline Soyer, T. Lasri, G. Guegan

Journal of the American Ceramic Society, 2011, 94, pp.1661-1663. ⟨10.1111/j.1551-2916.2011.04546.x⟩. ⟨hal-00603030⟩

• Article dans une revue

Vortex state in thin films of multicomponent ferroelectrics

Laurent Baudry, Anaïs Sené, Igor A. Luk'Yanchuk, Laurent Lahoche

The distribution of polarization in thin film of multicomponent weak anisotropic ferroelectric under application of an axially symmetric electric field induced by circular electrodes is studied. We demonstrate that above a certain critical field the instability towards abrupt formation of…

Thin Solid Films, 2011, 519 (17), pp.5808-5810. ⟨10.1016/j.tsf.2010.12.192⟩. ⟨hal-00603009⟩

• Communication dans un congrès

Propagation et filtrage des ondes acoustiques dans un cristal phononique bicouche AlN-TiN : étude théorique et expérimentale

S. Hemon, Y. El Hassouani, Yan Pennec, A. Soltani, Abdelkrim Talbi, A. Djouadi, Bahram Djafari-Rouhani, Abdellatif Akjouj

Journées Franco-Libanaises Physique et Interfaces, JFLPI, 2011, Villeneuve d'Ascq, France. ⟨hal-00807261⟩

• Communication dans un congrès

Charge generation efficiency of core-shell Si nanowires

T. Xu, J.P. Nys, Maxime Berthe, B. Grandidier, D. Stievenard, G. Patriarche, W. Chen, R. Larde, E. Cadel, P. Pareige, D.H.K. Murthy, T.J. Savenije

2èmes Journées Nanosciences et Nanotechnologies du C'nano Nord-Ouest, J2NO 2011, 2011, Rouen, France. ⟨hal-00807231⟩

• Communication dans un congrès

Theoretical investigation of thermal resistance at the Si/SiO2 interface

E. Lampin, F. Cleri, Q.H. Nguyen, P.A. Francioso

Materials Research Society Fall Meeting, MRS Fall 2011, Symposium W : Phonons in nanomaterials - Theory, experiments, and applications, 2011, Boston, MA, United States. ⟨hal-00807263⟩