Publications

Affichage de 7801 à 7810 sur 16457


  • Article dans une revue

Joint channel and phase noise estimation in OFDM systems at very high speeds

Jin Fang, Eric Pierre Simon, Marion Berbineau, M. Lienard

In this paper, the problem of joint phase noise and channel estimation for OFDM systems over a fast time-varying frequency-selective channel is explored. Each channel tap time-variation within one OFDM symbol is approximated by a Basis Expansion Model (BEM). Joint estimation is performed on…

AEÜ - International Journal of Electronics and Communications = Archiv für Elektronik und Übertragungstechnik, 2013, 67 (4), pp.295-300. ⟨10.1016/j.aeue.2012.09.002⟩. ⟨hal-00797209⟩

  • Communication dans un congrès

Extraordinary room temperature THz heterodyne detector: the self-switching nanodiode

J. Torres, P. Nouvel, A. Penot, L. Varani, P. Sangare, B. Grimbert, M. Faucher, Guillaume Ducournau, Christophe Gaquière, I. Iniguez-De-La-Torre, J. Mateos, T. Gonzalez

18th International Conference on Electron Dynamics in Semiconductors, Optoelectronics and Nanostructure, 2013, Matsue, Japan. ⟨hal-01926264⟩

  • Communication dans un congrès

InAlAs/InGaAa HEMTs on polyimide flexible substrate with high cut-off frequencies

J.S. Shi, Nicolas Wichmann, Yannick Roelens, S. Bollaert

Journées Nationales Technologies Emergentes en Micro-Nanofabrication, JNTE 2013, 2013, Evian, France. ⟨hal-00813609⟩

  • Autre publication scientifique

Vers une électronique terahertz : contribution à la technologie des transistors III-V

Mohammed Zaknoune

2013. ⟨hal-00813614⟩

  • Communication dans un congrès

Laser ultrasonics and mode conversion for flaw depth gauging

Frédéric Faëse, Frédéric Jenot, Mohammadi Ouaftouh, Marc Duquennoy, Mohamed Ourak

Compared to earliest non destructive testing and evaluation methods based on transducers, laser ultrasonics shows specific advantages. It is a non-contact method combining a high spatial resolution and a large bandwidth, allowing high temperature and/or geometrically complex materials testing. In…

13th International Symposium on Nondestructive Characterization of Materials, NDCM-XIII, 2013, Le Mans, France. paper 15509, 9 p. ⟨hal-00971600⟩

  • Communication dans un congrès

Interferometric scanning microwave microscope for nanotechnology application

N. Clement, Thomas Dargent, H. Tanbakuchi, K. Nishiguchi, R. Sivakumarasamy, F. Wang, A. Fujiwara, D. Ducatteau, Gilles Dambrine, D. Vuillaume, Bernard Legrand, D. Theron

American Physical Society March Meeting, APS March Meeting 2013, 2013, Baltimore, MD, United States. ⟨hal-00811777⟩