Publications

Affichage de 12781 à 12790 sur 16566


  • Communication dans un congrès

Characterisation of silicon nitride thin films used as stressor liners on CMOS FETs

G. Raymond, Pascal Morin, Arnaud Devos, D.A. Hess, M. Braccini, F. Volpi

Proceedings of the Third International Conference on Innovations on Thin Films Processing and Characterisation, ITFPC07, 2007, Nancy, France. ⟨hal-00366988⟩

  • Article dans une revue

Mechanical cross-characterisation of sputtered inconel thin films for MEMS applications

G. Fleury, C. Malhaire, C. Populaire, Mireille Verdier, Arnaud Devos, J.L. Charvet, J.P. Polizzi

Sensors and Actuators B: Chemical, 2007, 126 (1), pp.48-51. ⟨10.1016/j.snb.2006.10.038⟩. ⟨hal-00293917⟩