Publications
Affichage de 13991 à 14000 sur 16447
Modélisation et simulation de la technologie des MOS ultimes
Evelyne Lampin, Christophe Krzeminski, Tahsin Akalin, V. Cuny
Journées Nationales Nanoélectronique, 2004, Aussois, France. ⟨hal-00141007⟩
EXAFS characterization of the gel leading to a hydrothermal deposition of PZT films
S. Euphrasie, S. Daviero-Minaud, Philippe Pernod
Integrated Ferroelectrics, 2004, 60, pp.117-130. ⟨hal-00140718⟩
RF and noise properties of SOI MOSFETs, including the influence of a direct tunneling gate current
Francois Danneville, G. Pailloncy, Gilles Dambrine, B. Iniguez
2004, pp.103-110. ⟨hal-00154886⟩
Hot carrier aging degradation phenomena in GaN based MESFETs
F. Rampazzo, G. Pierobon, D. Pacetta, Christophe Gaquière, D. Theron, B. Boudart, G. Meneghesso, E. Zanoni
Microelectronics Reliability, 2004, 44, pp.1375-1380. ⟨hal-00154890⟩
Nonlinear ultrasonic phase-conjugate beams and their application in ultrasonic imaging
Andrey Brysev, Leonid Krutyansky, Philippe Pernod, Vladimir L. Preobrazhensky
Acoustical Physics, 2004, 50, pp.623-640. ⟨10.1134/1.1825091⟩. ⟨hal-00162757⟩
Analysis of low frequency drain current noise in AlGaN/GaN HEMTs on Si substrate
N. Malbert, N. Labat, A. Curutchet, A. Touboul, Christophe Gaquière, A. Minko
Fluctuation and Noise Letters, 2004, 4, pp.L319-L328. ⟨hal-00162793⟩
Noise modeling and performance in 0.15 µm fully depleted SOI MOSFET
G. Pailloncy, B. Iniguez, Gilles Dambrine, M. Dehan, J.P. Raskin, H. Matsuhashi, P. Delatte, Francois Danneville
2004, pp.122-130. ⟨hal-00133895⟩
Reconstruction of bubble translation in travelling ultrasonic waves
P. Koch, R. Mettin, T. Tervo, W. Lauterborn, Bertrand Dubus, A. Moussatov
9th Meeting of the European Society of Sonochemistry, 2004, Badajoz, Spain. ⟨hal-00133873⟩
One-dimensional reconstruction of a defect profile based on millimeter-wave nondestructive techniques
M. Maazi, D. Glay, T. Lasri
Microwave and Optical Technology Letters, 2004, 43, pp.133-138. ⟨hal-00133929⟩
Technologie pour dispositifs AlInAs/GaInAs
J.S. Galloo, E. Pichonat, S. Bollaert, Yannick Roelens, X. Wallart, A. Cappy
GDR Nanoélectronique, 2004, Aussois, France. ⟨hal-00133917⟩