Publications
Affichage de 11701 à 11710 sur 15024
Damaging process determination
L. Buchaillot, O. Millet
Symposium on Mechanical Reliability of Silicon MEMS – Recent progress and further requirements, 2006, Halle Saale, Germany. ⟨hal-00128690⟩
Feasibility of contact-less temperature control by microwave radiometry during sintering of powdered SiC and Al/SiC samples
C. Ricard, Luc Dubois, S. Vaucher, S. Leparoux, J.C. Camart, J. Pribetich
Microwave and Optical Technology Letters, 2006, 48, pp.2037-2041. ⟨hal-00154923⟩
Resonant transmission in stop bands of acoustic waves in periodic structures
Jean-Etienne Lefebvre, V. Zhang, Tadeusz Gryba
Ultrasonics, 2006, 44, pp.899-904. ⟨hal-00138602⟩
Analyse de la propagation des ondes dans des chaînes de billes
Anne-Christine Hladky, M. de Billy
Journées ‘Etude de la propagation ultrasonore en milieux non homogènes en vue du contrôle non destructif' du GDR US 2501, 2006, France. pp.34-38. ⟨hal-00369949⟩
Development and characterization of piezofiber based 1-3 ultrasonic composites
A.J. Schonecker, T. Rödig, Anne-Christine Hladky, T. Daue
2006 US Navy Workshop on Acoustic Transduction Materials and Devices, 2006, State College, PA, United States. ⟨hal-00369955⟩
Optoelectronic switch and memory devices based on polymer functionalized carbon nanotubes
J. Borghetti, Vincent Derycke, S. Lenfant, P. Chenevier, A. Filoramo, M. Goffman, D. Vuillaume, J.P. Bourgoin
Advanced Materials, 2006, 18, pp.2535-2540. ⟨hal-00127119⟩
Étude des propriétés électroniques de nanotubes de carbone par microscopie à force électrostatique et spectroscopie Raman
M. Zdrojek
2006. ⟨hal-00138945⟩
Design of a distributed oscillator in 130 nm SOI MOS technology
M. Si Moussa, C. Pavageau, L. Picheta, Francois Danneville, J. Russat, N. Fel, J.P. Raskin, D. Vanhoenacker-Janvier
2006, 4 pp. ⟨hal-00147510⟩
High-frequency and noise performances of 65-nm MOSFET at liquid nitrogen temperature
A. Siligaris, G. Pailloncy, S. Delcourt, R. Valentin, Sylvie Lepilliet, Francois Danneville, D. Gloria, Gilles Dambrine
IEEE Transactions on Electron Devices, 2006, 53, pp.1902-1908. ⟨hal-00126519⟩
Influence of gate offset spacer width on SOI MOSFETs HF properties
R. Valentin, A. Siligaris, G. Pailloncy, Emmanuel Dubois, Gilles Dambrine, Francois Danneville
2006, pp.77-80. ⟨hal-00126800⟩