Publications

• Article dans une revue

Explosive instability of quasi-phonon triads in antiferromagnet under frequency modulated electromagnetic field

Vladimir Preobrazhensky, O. Yevstafyev, Philippe Pernod, V. Berzhansky

Journal of Magnetism and Magnetic Materials, 2010, 322, pp.585-588. ⟨10.1016/j.jmmm.2009.09.067⟩. ⟨hal-00548960⟩

• Article dans une revue

Kinetics of RPECVD organosilicon polymer post-treatment in a N2/O2 microwave plasma remote afterglow

S. Abou Rich, V. Mille, Céline Vivien, S. Godey, P. Supiot

Plasma Processes and Polymers, 2010, 7, pp.775-784. ⟨10.1002/ppap.200900185⟩. ⟨hal-00549497⟩

• Article dans une revue

Wavelength and beam launching effects on silica optical fiber in local area networks

H. Mrabet, Iyad Dayoub, R. Attia, W. Hamouda

Optics Communications, 2010, 283, pp.4234-4241. ⟨10.1016/j.optcom.2010.06.034⟩. ⟨hal-00549472⟩

• Article dans une revue

Materials selection procedure for RF-MEMS

G. Guisbiers, E. Herth, Bernard Legrand, N. Rolland, T. Lasri, L. Buchaillot

Microelectronic Engineering, 2010, 87, pp.1792-1795. ⟨10.1016/j.mee.2009.10.016⟩. ⟨hal-00549627⟩

• Article dans une revue

Unusual Curie point independence of thickness and interfacial properties for perfectly (111)-oriented Ba0.6Sr0.4TiO3 thin films

L.H. Yang, G.S. Wang, X.L. Dong, Denis Remiens

Journal of the American Ceramic Society, 2010, 93, pp.2526-2529. ⟨10.1111/j.1551-2916.2010.03877.x⟩. ⟨hal-00549533⟩

• Article dans une revue

Ultrasonic and acoustic investigation of cheese matrix at the beginning and the end of ripening period

Georges Nassar, Fabrice Lefebvre, A. Skaf, Julien Carlier, Bertrand Nongaillard, Y. Noel

In this paper, a low frequency, dry contact, ultrasonic technique devoted to the study and characterization of cheeses at the beginning and the end of ripening period is investigated. For compact or weakly opened matrix found in the early step of cheese making, ultrasonic velocity is indicated to…

Journal of Food Engineering, 2010, 96, pp.1-13. ⟨10.1016/j.jfoodeng.2009.06.029⟩. ⟨hal-00549529⟩

• Article dans une revue

Correlation-induced conductance suppression at level degeneracy in a quantum dot

H.A. Nilsson, O. Karlström, M. Larsson, P. Caroff, J.N. Pedersen, L. Samuelson, A. Wacker, L.E. Wernersson, H.Q. Xu

The large, level-dependent g-factors in an InSb nanowire quantum dot allow for the occurrence of a variety of level crossings in the dot. While we observe the standard conductance enhancement in the Coulomb blockade region for aligned levels with different spins due to the Kondo effect, a vanishing…

Physical Review Letters, 2010, 104 (18), pp.186804. ⟨10.1103/PhysRevLett.104.186804⟩. ⟨hal-00548700⟩

• Article dans une revue

Quantitative testing of robustness on superomniphobic surfaces by drop impact

Thi Phuong Nhung Nguyen, Philippe Brunet, Yannick Coffinier, Rabah Boukherroub

The quality of a liquid-repellent surface is quantified by both the apparent contact angle θ0 that a sessile drop adopts on it, and the value of the liquid pressure threshold the surface can withstand without being impaled by the liquid, hence keeping a low-friction condition. We designed surfaces…

Langmuir, 2010, 26 (23), pp.18369-18373. ⟨10.1021/la103097y⟩. ⟨hal-00551284⟩

• Article dans une revue

Two-terminal carbon nanotube programmable devices for adaptive architectures

Guillaume Agnus, Weisheng Zhao, Vincent Derycke, Arianna Filoramo, Y. Lhuillier, S. Lenfant, D. Vuillaume, C. Gamrat, J.P. Bourgoin

Carbon nanotube field-effect transistors functionalized with photoconducting polymer act as very efficient and non-volatile two-terminal programmable devices (see figure). Their optoelectronic programmability allows compensating for the critical issue of variability among as-built devices in…

Advanced Materials, 2010, 22, pp.702-706. ⟨10.1002/adma.200902170⟩. ⟨hal-00548986⟩

• Communication dans un congrès

Effects of the drain width on the electrical behavior of deep defect in AlGaN/GaN/SiC HEMTs

O. Fathallah, M. Gassoumi, S. Saadaoui, B. Grimbert, Christophe Gaquière, H. Maaref

27th International Conference on Microelectronics, MIEL 2010, 2010, pp.479-481, ⟨10.1109/MIEL.2010.5490440⟩. ⟨hal-00550032⟩