Publications
Affichage de 11951 à 11960 sur 16560
Piezoelectric thin films for MEMS applications - A comparative study of PZT, 0.7PMN-0.3PT and 0.9PMN-0.1PT thin films grown on Si by r.f. magnetron sputtering
R. Herdier, M. Detalle, D. Jenkins, Caroline Soyer, Denis Remiens
Sensors and Actuators A: Physical , 2008, 148, pp.122-128. ⟨10.1016/j.sna.2008.07.021⟩. ⟨hal-00360331⟩
Etching characteristics and absence of electrical properties damage of PZT thin films etched before crystallization
R.H. Liang, Denis Remiens, Caroline Soyer, N. Sama, X.L. Dong, G.S. Wang
Microelectronic Engineering, 2008, 85, pp.670-674. ⟨10.1016/j.mee.2007.12.031⟩. ⟨hal-00360094⟩
Characterization of nanogap chemical reactivity using peptide-capped gold nanoparticles and electrical detection
L. Marcon, D. Stiévenard, O. Melnyk
30th European Peptide Symposium, 30EPS, 2008, Helsinki, Finland. ⟨hal-00362013⟩
Development of a suitable PML for an harmonic study of a finite 1D phononic crystal
M. Bavencoffe, B. Morvan, Anne-Christine Hladky, Olivier Bou Matar, J.L. Izbicki
Second ASA-EAA Joint Conference, ACOUSTICS'08, 2008, Paris, France. ⟨hal-00361489⟩
Matrices de commutation par effets d'injection de porteurs libres sur InP
N. Chouieb
2008. ⟨hal-00362114⟩
Random telegraph signal in macroscopic silicon/alkyl chain/metal molecular tunnel junctions
N. Clement, S. Pleutin, David Guérin, D. Cahen, D. Vuillaume
4th International Meeting on Molecular Electronics, ElecMol'08, 2008, Grenoble, France. ⟨hal-00361967⟩
Selective etching of implanted silicon dioxide in hydrofluoric acid
V. Passi, Aurélie Lecestre, Emmanuel Dubois, J.P. Raskin
34th International Conference on Micro and Nano Engineering, MNE 2008, 2008, Athens, Greece. ⟨hal-00361548⟩
Structural health monitoring using cross-correlation of an ambient noise field
Najib Abou Leyla, Emmanuel Moulin, Jamal Assaad, Sébastien Grondel, Pascal Poussot
Second ASA-EAA Joint Conference, ACOUSTICS'08, 2008, Paris, France. ⟨10.1121/1.2935098⟩. ⟨hal-00362060⟩
Contribution à l'étude du rayonnement des câbles soumis aux signaux de l'électronique de puissance dans un environnement aéronautique
Jérôme Genoulaz
2008. ⟨hal-00800590⟩
TEM characterization of Si nanowires grown by CVD on Si pre-structured by nanosphere lithography
J.K.N. Lindner, D. Hourlier, D. Kraus, M. Weinl, Thierry Melin, B. Stritzker
Materials Science in Semiconductor Processing, 2008, 11, pp.169-174. ⟨10.1016/j.mssp.2008.09.016⟩. ⟨hal-00800706⟩