Publications
Affichage de 12041 à 12050 sur 16561
Piezoelectric characteristics of metal ferroelectric metal structure on indium tin oxide coated silicon and glass substrate by sputtering
El Hadj Dogheche, L. Kerkache, D. Jenkins, P. Roussel
20th International Symposium on Integrated Ferroelectrics, ISIF 2008, 2008, Singapour, Singapore. ⟨hal-00811724⟩
Electromagnetic compatibility analysis of unstructured mains networks for high-speed data transmission : part 1
S. Battermann, H. Garbe, F. Silva, M. Pous, V. Beauvois, K. Vantomme, J. Catrysse, J. Newbury, Virginie Degardin, M. Liénard, Pierre Degauque, I.D. Flintoft, A.D. Papatsoris, D.W. Welsh, A.C. Marvin
IET Science Measurement & Technology, 2008, 2, pp.146-153. ⟨10.1049/iet-smt:20070055⟩. ⟨hal-00360048⟩
Evaluation de l'état des ouvrages en béton par combinaison de techniques non destructives, Evaluation of concrete structures by combining non destructive testing methods
J.P. Balayssac, S. Laurens, Ginette Arliguie, M.A. Ploix, D. Breysse, Bogdan Piwakowski, Géraldine Villain
Journées COFREND 2008, 2008, Toulouse, France. papier 47, 1-14. ⟨hal-00814962⟩
NANOSIL Network of Excellence : silicon-based nanostructures and nanodevices for long-term nanoelectronics applications
F. Balestra, E. Parker, D. Leadley, S. Mantl, Emmanuel Dubois, O. Engstrom, R. Clerc, S. Cristoloveanu, H. Kurz, J.P. Raskin, M. Lemme, A. Ionescu, E. Kasper, A. Karmous, M. Baus, B. Spangenberg, M. Ostling, E. Sangiorgi, G. Ghibaudo, D. Flandre
European Materials Research Society Spring Meeting, E-MRS Spring 2008, Symposium I : Front-end junction and contact formation in future Silicon/Germanium based devices, 2008, Strasbourg, France. ⟨hal-00361546⟩
Integration of PtSi in p-type MOSFETs using a sacrificial low-temperature germanidation process
Nicolas Breil, Emmanuel Dubois, Aomar Halimaoui, Arnaud Pouydebasque, Guilhem Larrieu, Adam Laszcz, J. Ratajcak, Thomas Skotnicki
IEEE Electron Device Letters, 2008, 29, pp.152-154. ⟨10.1109/LED.2007.914090⟩. ⟨hal-00356971⟩
Gold metallogeny in the Birimian craton of Burkina Faso.
Didier Béziat, M. Dubois, Pierre Debat, Serge Nikiéma, S. Salvi, Francis Tollon
Journal of African Earth Sciences, 2008, pp.215-233. ⟨hal-00326270⟩
Molecular dynamics simulation of the recrystallization of disordered Si layers
E. Lampin, Christophe Krzeminski
Workshop SiMaDes-II, Atomic scale simulations and experimental studies of disordered systems, 2008, Grenoble, France. ⟨hal-00361542⟩
Comparative Sb and As segregation at the InP on GaAsSb interface
X. Wallart, S. Godey, Y. Douvry, L. Desplanque
Applied Physics Letters, 2008, 93, pp.123119-1-3. ⟨10.1063/1.2991299⟩. ⟨hal-00356947⟩
Molecular-scale electronics
D. Vuillaume
Comptes Rendus. Physique, 2008, 9, pp.78-94. ⟨10.1016/j.crhy.2007.10.014⟩. ⟨hal-00357286⟩