Publications
Affichage de 12761 à 12770 sur 16175
Ultra wide band dielectric spectroscopy of single cell in microfluidic devices
Vincent Senez, A. Treizebre, Erwan Lennon, Hind Ghandour, Vianney Mille, Thomas Heim, Tahsin Akalin, Takahisa Yamamoto, Nour Eddine Bourzgui, Dominique Legrand, Yasuyuki Sakai, Philippe Supiot, Joël Mazurier, Teruo Fujii, Bertrand Bocquet
10th International Conference on Miniaturized Systems for Chemistry and Life Sciences (uTAS2006), Nov 2006, Tokyo, Japan. pp.738-740. ⟨hal-00130877⟩
A fully InP monolithic integrated millimeter-wave reflectometer
Kamel Haddadi, H. El Aabbaoui, B. Gorisse, D. Glay, N. Rolland, T. Lasri
2006, pp.703-706. ⟨hal-00147515⟩
Design of distributed amplifiers and oscillators in 130 nm SOI MOS technology
M. Si Moussa, C. Pavageau, L. Picheta, Francois Danneville, J. Russat, N. Fel, J.P. Raskin, D. Vanhoenacker-Janvier
2006, 4 pp. ⟨hal-00128229⟩
Electronic structure of semiconductor nanowires
Y.M. Niquet, A. Lherbier, N.H. Quang, M.V. Fernandez-Serra, X. Blase, C. Delerue
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2006, 73, pp.165319-1-13. ⟨hal-00127831⟩
Nanometric acoustic cross-talk device
L. Dobrzynski, Housni Al-Wahsh, Abdellatif Akjouj, G. Hernandez-Cocoletzi
Journal of Physics: Condensed Matter, 2006, 18 (12), pp.3151-3156. ⟨10.1088/0953-8984/18/12/001⟩. ⟨hal-00127849⟩
Damaging process determination
L. Buchaillot, O. Millet
Symposium on Mechanical Reliability of Silicon MEMS – Recent progress and further requirements, 2006, Halle Saale, Germany. ⟨hal-00128690⟩
Propriétés élastiques de réseaux de nanostructures sondées par acoustique picoseconde. Sélection de modes en longueur d'onde
J.F. Robillard, Arnaud Devos, I. Roch-Jeune
10èmes Journées de la Matière Condensée, JMC10, 2006, Toulouse, France. ⟨hal-00126496⟩
Free-carrier absorption and growth temperature of highly Be-doped InGaAs in molecular beam epitaxy
D. Vignaud, M. Zaknoune, F. Mollot
Journal of Crystal Growth, 2006, 291, pp.107-111. ⟨hal-00127061⟩
L'acoustique picoseconde : un outil de métrologie mécanique de couches minces appliqué à la microéléctronique
P. Emery, Arnaud Devos
10èmes Journées de la Matière Condensée, JMC10, 2006, Toulouse, France. ⟨hal-00126497⟩