Publications
Affichage de 13281 à 13290 sur 16279
Thermal stability of Mo-based Schottky contact for AlGaN/GaN HEMT
A. Sozza, C. Dua, E. Morvan, B. Grimbert, M.A. Diforte-Poisson, S.L. Delage, E. Zanoni
Electronics Letters, 2005, 41, pp.927-928. ⟨hal-00126456⟩
Electronic properties of molecular nanostructures
D. Vuillaume
Nanotech 2005, Japan-France Workshop on Nanosciences and Nanotechnologies, 2005, Tokyo, Japan. ⟨hal-00125615⟩
Exons, introns and DNA thermodynamics
Enrico Carlon, Mehdi Lejard Malki, Ralf Blossey
Physical Review Letters, 2005, 94, pp.178101. ⟨10.1103/PhysRevLett.94.178101⟩. ⟨hal-00128506⟩
Potentials of radio over multimode fiber systems for the in-buildings coverage of mobile and wireless LAN applications
C. Lethien, Christophe Loyez, Jean-Pierre Vilcot
IEEE Photonics Technology Letters, 2005, 17, pp.2793-2795. ⟨hal-00125333⟩
Deposition of TTF derivative on carboxyl terminated self-assembled monolayers
H. Onuki, M. Izumi, S. Lenfant, David Guérin, T. Imakubo, D. Vuillaume
Applied Surface Science, 2005, 246, pp.392-396. ⟨hal-00125387⟩
Conception d'un système d'échantillonnage à 40 GS/s en technologie InP HBT pour les signaux large bande non répétitifs
H. El Aabbaoui, N. Rolland, B. Gorisse, A. Benlarbi-Delai, N. Fel, V. Allouche, P. Leclerc, B. Riondet, P.A. Rolland
Actes des 14èmes Journées Nationales Microondes, 2005, Nantes, France. ⟨hal-00126731⟩
Amplificateur distribué de puissance en technologie HEMT GaN
A. Philippon, S. de Meyer, Michel Campovecchio, D. Floriot, S. Piotrowicz, Raymond Quéré
Actes des 14èmes Journées Nationales Microondes, 2005, Nantes, France. ⟨hal-00126737⟩
MEMS reliability : metrology set-up for investigation of fatigue causes
O. Millet, O. Blanrue, Bernard Legrand, D. Collard, L. Buchaillot
2005, pp.483-486. ⟨hal-00125627⟩
New HEMT structures for THz applications
A. Cappy, Nicolas Wichmann, S. Bollaert, X. Wallart, Yannick Roelens, A. Shchepetov, W. Knap
Device Research Conference, DRC 2005, 2005, Santa Barbara, CA, United States. ⟨hal-00125315⟩
An investigation of temperature effects on CPW and MSL on SOI substrate for RF applications
M. Si Moussa, C. Pavageau, D. Lederer, L. Picheta, Francois Danneville, J. Russat, N. Fel, J.P. Raskin
2005, pp.70-71. ⟨hal-00125308⟩