Publications
Affichage de 13291 à 13300 sur 16055
Comparison between carried-induced optical index, loss variations and carrier lifetime in GalnAsP/InP heterostructures for 1.55 μm DOS application
Malek Zegaoui, Didier Decoster, Joseph Harari, Jean-Pierre Vilcot, F. Mollot, V. Magnin, Jean Chazelas
Electronics Letters, 2005, 41 (10), pp.613-614. ⟨10.1049/el:20050770⟩. ⟨hal-00125658⟩
Utilisation des technologies CMOS SOI 130 nm pour des applications en gamme de fréquences
C. Pavageau
2005. ⟨hal-00126201⟩
Composition modulation and local structure in strained diluted GaInNAs nitride alloy thin layers
C. Priester, A. Metsue
2005, pp.0891-EE10-29.1 - 0891-EE10-29.6. ⟨hal-00126205⟩
Comparison between DS-CDMA and modified Gegenbauer functions for a multi-user communication Ultra Wide Band system
F. Elbahhar, Atika Rivenq, Jean-Michel Rouvaen, Marc Heddebaut, Tariq Boukour
IEE Proceedings. Communications, 2005, 152 (6), pp.1021-1028. ⟨10.1049/ip-com:20045236⟩. ⟨hal-00126472⟩
Amélioration des transmissions vidéo MPEG-2 sur lignes ADSL basée sur une optimisation conjointe source/canal de la qualité vidéo
C. Goudemand
2005. ⟨hal-00126473⟩
Noise in SOI MOSFETs and gate-all-around transistors
B. Iniguez, A. Lazaro, H.A. Hamid, G. Pailloncy, Gilles Dambrine, Francois Danneville
18th International Conference on Noise and Fluctuations, ICNF 2005, 2005, Salamanca, Spain. ⟨hal-00125321⟩
Inelastic electron tunnelling in metal/alkylsilane/silicon junctions
K. Lmimouni, C. Petit, G. Salace, S. Lenfant, D. Vuillaume
ElecMol'05, 2005, Grenoble, France. ⟨hal-00125604⟩
Role of interface on the direct tunneling and the inelastic tunneling behaviors in metal/alkylsilane/silicon junctions
D. Vuillaume, D. K. Aswal, David Guérin, S. Lenfant, C. Petit, G. Salace, J. V. Yakhmi
French-Russian workshop on nanosciences and nanotechnologies, 2005, Lille, France. ⟨hal-00125618⟩
CBr4 and Be heavily doped InGaAs grown in a production MBE system
S. Godey, S. Dhellemmes, A. Wilk, M. Zaknoune, F. Mollot
Journal of Crystal Growth, 2005, 278, pp.600-603. ⟨hal-00154907⟩