Publications

• Article dans une revue

High In content pseudomorphic InGaAs layers for high mobility heterostructures on InP(001)

X. Wallart, B. Pinsard, F. Mollot

Journal of Crystal Growth, 2005, 278, pp.516-520. ⟨hal-00125354⟩

• Communication dans un congrès

Interactions moléculaires de PTCDA sur Pd(111)

Maxime Berthe, J.P. Nys, B. Grandidier, X. Wallart, D. Stievenard

Forum des microscopies à champ proche, 2005, Anglet, France. ⟨hal-00126445⟩

• Communication dans un congrès

A 2000 hours storage test on AlGaN/GaN HEMTs for RF and microwave applications

A. Sozza, C. Dua, E. Morvan, B. Grimbert, S.L. Delage, E. Zanoni

29th Workshop on Compound Semiconductor Devices and Integrated Circuits, WOCSDICE 2005, 2005, Cardiff, United Kingdom. ⟨hal-00126467⟩

• Article dans une revue

Reduction of colour bleeding for 4:1:1 compressed video

François-Xavier Coudoux, Marc G. Gazalet, Patrick Corlay

IEEE Transactions on Broadcasting, 2005, 51, pp.538-542. ⟨hal-00126483⟩

• Communication dans un congrès

Nanotransistors pour émission THz

S. Bollaert, Yannick Roelens, A. Shchepetov, X. Wallart, A. Cappy, J. Lusakowski, W. Knap, N. Dyakonova, M. Dyakonov

3èmes Journées THz, 2005, Aussois, France. ⟨hal-00125897⟩

• Article dans une revue

Raman spectra of BN-nanotubes : ab-initio and bond-polarizability model calculations

L. Wirtz, M. Lazzeri, Francesco Mauri, A. Rubio

Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2005, 71, pp.241402-1-4. ⟨hal-00126424⟩

• Article dans une revue

Pseudopath semiclassical approximation to transport through open quantum billiards : Dyson equation for diffractive scattering

C. Stampfer, S. Rotter, J. Burgdorfer, L. Wirtz

Physical Review E : Statistical, Nonlinear, and Soft Matter Physics [2001-2015], 2005, 72, pp.036223-1-11. ⟨hal-00126423⟩

• Communication dans un congrès

Electric force microscopy of individually charged semiconductor nanoparticles

Heinrich Diesinger, Thierry Melin, Sophie Barbet, D. Deresmes, Didier Stiévenard

Charge injection experiments by electrostatic force microscopy are performed on single semiconductor nanoparticles. Different methods of detecting the stored charge are used. Although the amount of charge stored in particles of realistic shape can be determined quantitatively, we present here a…

Trends in Nanotechnology, TNT 2005, Aug 2005, Oviedo, Spain. ⟨hal-00126431⟩

• Communication dans un congrès

Semiconductor surface reconstructions of the Si(100) surface at 5K

A. Urbieta, B. Grandidier, J.P. Nys, D. Deresmes, D. Stiévenard

52nd International Symposium and Exhibition of the American Vacuum Society, AVS-52, 2005, Boston, MA, United States. ⟨hal-00126447⟩

• Communication dans un congrès

Forster energy transfer between semiconductor nanocrystals

Guy Allan, Christophe Delerue

Materials Research Society 2005 Fall Meeting, 2005, Boston, MA, United States. ⟨hal-00126434⟩