Publications
Affichage de 13441 à 13450 sur 16175
Behavior of a common source traveling wave amplifier versus temperature in SOI technology
M. Si Moussa, C. Pavageau, P. Simon, Francois Danneville, J. Russat, N. Fel, J.P. Raskin, D. Vanhoenacker-Janvier
2005, 4 pp. ⟨hal-00126768⟩
Nanostructured magnetostrictive material induced by heavy ion irradiation
J. Juraszek, J. Teillet, A. Grenier, Nicolas Tiercelin, T. Hauet, S. Mangin
Proceedings of the 28th International Conference on the Applications of the Mössbauer Effect ICAME 2005, 2005, Montpellier, France. ⟨hal-00139244⟩
Contact-less volumetric temperature monitoring by microwave radiometry during microwave heating of metal-ceramic composite powders
S. Vaucher, C. Ricard, Luc Dubois, J. Pribetich
Proceedings of the 10th International Conference on Microwave and High Frequency Heating, 2005, Modena, Italy. ⟨hal-00131117⟩
Metrology of thin dielectric films using picosecond ultrasonics
Arnaud Devos, R. Cote, G. Caruyer
2005, ThDpm1-07. ⟨hal-00131101⟩
UWB serves inter-vehicle communication and location
L. Le Cloirec, Bertrand Bocquet, A. Benlarbi-Delai, Christophe Loyez
Proceedings of the 5th International Conference on ITS Telecommunications, ITST 2005, Jun 2005, Brest, France. ⟨hal-00131125⟩
Comparison of load-pull measurement results of a 4 W pHEMT involving five european laboratories
J. Lees, J. Benedikt, B. Bunz, Christophe Gaquière, D. Ducatteau, E. Marquez-Segura, T.M. Martin-Guerrero, A. Barel
2005, pp.321-324. ⟨hal-00154916⟩
Réalisation de géométries complexes fines de céramiques PZT par découpe laser
Christian Courtois, Mohamed Rguiti, M. Lippert, Philippe Champagne, Sébastien Grondel, F. El Youbi, Anne Leriche, M. Brussieux
Actes de Electrotechnique du Futur, EF'2005, 2005, Grenoble, France. ⟨hal-00140796⟩
Stereoscopic displays
Jean-Claude Kastelik, Marc G. Gazalet
DEKKER M. Encyclopedia of Optical Engineering, Taylor & Francis, pp.1-8, 2005, ⟨10.1081/E-EOE-120021859⟩. ⟨hal-00137233⟩
100-nm T-gate In0.53Ga0.47As-In0.52Al0.48As DG-HEMTs with two separate gate controls
Nicolas Wichmann, I. Duszynski, X. Wallart, S. Bollaert, A. Cappy
IEEE Electron Device Letters, 2005, 26, pp.601-603. ⟨hal-00125132⟩