Publications
Affichage de 13661 à 13670 sur 16090
Electromagnetic susceptibility of IC's due to HPM coupling
S. Bazzoli, B. Demoulin, P. Hoffmann, M. Cauterman
2004, pp.95. ⟨hal-00142335⟩
Mode stirred chambers for simulating MIMO channels
M. Lienard, Pierre Laly, Pierre Degauque
Proceedings of the COST 273 Meeting, 2004, Athenes, Greece. ⟨hal-00142317⟩
Health monitoring of a composite wingbox structure. Application to the characterization of damaging impacts and debonding stiffener
Sébastien Grondel, Jamal Assaad, Christophe Delebarre, Emmanuel Moulin
Ultrasonics, 2004, 42, pp.819-824. ⟨hal-00141976⟩
Application of the FEM and the BEM to compute the field of a transducer mounted in a rigid baffle (3D case)
Jamal Assaad, Anne-Christine Hladky, B. Cugnet
Ultrasonics, 2004, 42, pp.443-446. ⟨hal-00141977⟩
Propagation of Lamb waves on rough plates : analysis of the beam section
D. Leduc, Catherine Potel, B. Morvan, C. Depollier, P. Pareige, Anne-Christine Hladky, J.L. Izbicki
2004, pp.164-171. ⟨hal-00142042⟩
Pressure and solvents resistant microsystem for monolithic column integration
K. Chuda, X. Coqueret, Julien Carlier, V. Thomy, C. Druon, P. Tabourier, J.C. Camart
Proceedings of the 40th IUPAC International Symposium on Macromolecules - World Polymer Congress MACRO 2004, 2004, Paris, France. ⟨hal-00142069⟩
Reliability investigation of gallium nitride HEMT microelectronics reliability
A. Sozza, C. Dua, E. Morvan, B. Grimbert, Virginie Hoel, S.L. Delage, N. Chaturvedi, R. Lossy, J. Wuerfl
Microelectronics Reliability, 2004, 44, pp.1369-1373. ⟨hal-00141958⟩
Microwave performances of gallium nitride based HEMT's devices
Christophe Gaquière, N. Vellas, M. Werquin, D. Ducatteau, E. Delos, E. Chartier, D. Lancereau, H. Gerard, M.A. Poisson, Y. Cordier, Marie Germain, E. Morvan, B. Grimbert, Virginie Hoel, Et Al.
European Microwave Week, 2004, Amsterdam, Netherlands. ⟨hal-00141962⟩
Using low frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction
Jean-Guy Tartarin, Geoffroy Soubercaze-Pun, Abdelali Rennane, Laurent Bary, Jean-Claude de Jaeger, Marie Germain, S. Delage, Robert Plana, Jacques Graffeuil
Using low frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction . 2004, pp.296-306. ⟨hal-00141968⟩