Publications

Affichage de 13681 à 13690 sur 16056


  • ART

Noise modeling in fully depleted SOI MOSFETs

G. Pailloncy, B. Iniguez, Gilles Dambrine, J.P. Raskin, Francois Danneville

Solid-State Electronics, 2004, 48, pp.813-825. ⟨hal-00133880⟩

  • COMM

Transition from ballistic to ohmic transport in T-branch junctions at room temperature in GaInAs/AlInAs heterostructures

Jean-Sebastien Galloo, Emmanuelle Pichonat, Yannick Roelens, S. Bollaert, X. Wallart, A. Cappy, Javier Mateos, Tomás González, Hervé Boutry, Vincent Bayot, Lukasz Bednarz, Isabelle Huynen

We have developed technolow based on GaInAs/AIInAs for building ballistic devices working at room temperature. We present processes for ballistic devices (T-Branch Junctions (TBJs), YBranch Junctions (YBJs)). Then we present DC Characterization of TBJs to show the transition from ballistic to ohmic…

16th IPRM. 2004 International Conference on Indium Phosphide and Related Materials, May 2004, Kagoshima, Japan. pp.378-381, ⟨10.1109/ICIPRM.2004.1442734⟩. ⟨hal-00133896⟩

  • COMM

Bruit haute fréquence dans les transistors MOS sur SOI : méthodes de caractérisations et de modélisations

G. Pailloncy

WORKSHOP Laboratoire Commun IEMN/ST Microelectronics, 2004, Crolles, France. ⟨hal-00133898⟩

  • COMM

Etude de l'interaction électron-électron dans les structures lasers à cascade quantique par la méthode de Monte Carlo

Olivier Bonno, Jean-Luc Thobel, François Dessenne

Journées Nationales Nanoélectronique, 2004, Aussois, France. ⟨hal-00133958⟩

  • COMM

Composants balistiques

S. Bollaert

Journées Nationales Microélectronique et Optoélectronique, 2004, La Grande Motte, France. ⟨hal-00133910⟩

  • ART

Hysteretic behavior of the charge injection in single silicon nanoparticles

H. Diesinger, Thierry Melin, D. Deresmes, D. Stievenard, T. Baron

Applied Physics Letters, 2004, 85, pp.3546-3548. ⟨hal-00141252⟩

  • COMM

Formation of nano-domains in alkyltrichlorosilane self-assembled monolayers deposited on silicon : applications to molecular electronics

S. Desbief, L. Patrone, D. Goguenheim, D. Vuillaume

Ultimate Lithography and Nanodevice Engineering, 2004, Agelonde, France. ⟨hal-00140740⟩

  • COMM

Novel 2D Interfaces for Nanoelectrospray-Mass Spectrometry

S. Arscott

Nanotech2004, 2004, Boston, United States. ⟨hal-02347767⟩