Publications
Affichage de 13761 à 13770 sur 16083
Determination of carrier-induced optical index and loss variations in GaInAsP/InP heterostructures from static and dynamic Mach-Zehnder interferometer measurements
Malek Zegaoui, Joseph Harari, Jean-Pierre Vilcot, F. Mollot, Didier Decoster, H. Li, Jean Chazelas
Electronics Letters, 2004, 40 (16), pp.1019-1020. ⟨10.1049/el_20045539⟩. ⟨hal-00141174⟩
Potentiel d'échange et de corrélation dans des nanostructures de semiconducteurs
Christophe Delerue, Guy Allan, Michel Lannoo
Réunion du GDR-DFT, 2004, La Londe Les Maures, France. ⟨hal-00141288⟩
Current understanding and modelling of B diffusion and activation anomalies in preamorphized ultra-shallow junctions
Bernard Colombeau, A. Smith, N.E.B. Cowern, B. Pawlak, Fuccio Cristiano, R. Duffy, Alain Claverie, C.J. Ortiz, P. Pichler, E. Lampin, C. Zechner
2004, pp.91-102. ⟨hal-00140989⟩
Simulation et optimisation d'une mémoire flash nanométrique
Christophe Krzeminski, Emmanuel Dubois, Xing Tang, N. Reckinger, A. Crahay, V. Bayot
Journées Nationales Nanoélectronique, 2004, Aussois, France. ⟨hal-00140993⟩
On the modelling of transient diffusion and activation of boron during post-implantation annealing
P. Pichler, C.J. Ortiz, B. Colombeau, N.E.B. Cowern, E. Lampin, Alain Claverie, Fuccio Cristiano, W. Lerch, S. Paul
International Electron Devices Meeting, IEDM 2004, 2004, San Francisco, CA, United States. ⟨hal-00141013⟩
Mode stirred chambers for simulating MIMO channels
M. Lienard, Pierre Laly, Pierre Degauque
Proceedings of the COST 273 Meeting, 2004, Athenes, Greece. ⟨hal-00142317⟩
Electromagnetic susceptibility of IC's due to HPM coupling
S. Bazzoli, B. Demoulin, P. Hoffmann, M. Cauterman
2004, pp.95. ⟨hal-00142335⟩
Using low frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction
Jean-Guy Tartarin, Geoffroy Soubercaze-Pun, Abdelali Rennane, Laurent Bary, Jean-Claude de Jaeger, Marie Germain, S. Delage, Robert Plana, Jacques Graffeuil
Using low frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction . 2004, pp.296-306. ⟨hal-00141968⟩
Application of the FEM and the BEM to compute the field of a transducer mounted in a rigid baffle (3D case)
Jamal Assaad, Anne-Christine Hladky, B. Cugnet
Ultrasonics, 2004, 42, pp.443-446. ⟨hal-00141977⟩
Signal processing for damage detection using two different array transducers
Faysal El Youbi, Sébastien Grondel, Jamal Assaad
Ultrasonics, 2004, 42, pp.803-806. ⟨10.1016/j.ultras.2004.01.070⟩. ⟨hal-00142003⟩