Publications

• ART

Analysis of low frequency drain current noise in AlGaN/GaN HEMTs on Si substrate

N. Malbert, N. Labat, A. Curutchet, A. Touboul, Christophe Gaquière, A. Minko

Fluctuation and Noise Letters, 2004, 4, pp.L319-L328. ⟨hal-00162793⟩

• ART

Nonlinear ultrasonic phase-conjugate beams and their application in ultrasonic imaging

Andrey Brysev, Leonid Krutyansky, Philippe Pernod, Vladimir L. Preobrazhensky

The latest results of experimental and theoretical research into phase conjugation of nonlinear ultrasonic beams are generalized, and prospects for the development of nonlinear ultrasonic imaging are outlined.

Acoustical Physics, 2004, 50, pp.623-640. ⟨10.1134/1.1825091⟩. ⟨hal-00162757⟩

• COMM

2D numerical simulation of supercritical phase conjugation of ultrasound in active solid

Olivier Bou Matar, Vladimir Preobrazhensky, Philippe Pernod

2004, pp.1627-1630. ⟨hal-00162781⟩

• COMM

Principles of ultrasonic velocimetry by means of nonlinear interaction of phase conjugate waves

Y. Pyl'Nov, Vladimir Preobrazhensky

2004, pp.1612-1615. ⟨hal-00162782⟩

• COMM

Noise modeling and performance in 0.15 µm fully depleted SOI MOSFET

G. Pailloncy, B. Iniguez, Gilles Dambrine, M. Dehan, J.P. Raskin, H. Matsuhashi, P. Delatte, Francois Danneville

2004, pp.122-130. ⟨hal-00133895⟩

• COMM

Stage de sensibilisation au travail en salle blanche et caractérisation d'une pince en polymère actionnée par un alliage à mémoire de forme en film mince

I. Roch, S. Masson, P. Delemotte, Philippe Pernod, H. Happy

8èmes Journées Pédagogiques du CNFM, 2004, Saint-Malo, France. ⟨hal-00133918⟩

• ART

One-dimensional reconstruction of a defect profile based on millimeter-wave nondestructive techniques

M. Maazi, D. Glay, T. Lasri

Microwave and Optical Technology Letters, 2004, 43, pp.133-138. ⟨hal-00133929⟩

• ART

Aluminum, oxide and silicon phonons by IETS on MOS tunnel junctions : accurate determination and effect of electrical stress

C. Petit, G. Salace, D. Vuillaume

Journal of Applied Physics, 2004, 96, pp.5042-5049. ⟨hal-00140733⟩

• ART

Conductivity of DNA probed by conducting-atomic force microscopy : effects of contact electrode, DNA stucture and surface interactions

T. Heim, D. Deresmes, Dominique Vuillaume

Journal of Applied Physics, 2004, 96, pp.2927-2936. ⟨10.1063/1.1769606⟩. ⟨hal-00140730⟩

• COUV

High frequency noise sources extraction in nanometric MOSFETs

Francois Danneville, G. Pailloncy, Gilles Dambrine

Sikula J., Levinshtein M. Advanced experimental methods for noise research in nanoscale electronic devices, Kluwer Academic Publisher, pp.169-176, 2004, NATO Science Series II. Mathematics, Physics and Chemistry. ⟨hal-00577020⟩