Publications

Affichage de 13821 à 13830 sur 16175


  • Communication dans un congrès

Quasi-particle gap, dielectric properties and electronic correlations in semiconductor nanostructures

Christophe Delerue, Michel Lannoo, Guy Allan

Workshop on Theory and Modeling of Electronic Excitations in Nanoscience, NANOEXC2004, 2004, Acquafredda di Maratea, Italy. ⟨hal-00141287⟩

  • Communication dans un congrès

Self-assembled molecular diodes on silicon

S. Lenfant, C. Merckling, David Guérin, D. Vuillaume, F. Tran Van, C. Chevrot

Ultimate Lithography and Nanodevice Engineering, 2004, Agelonde, France. ⟨hal-00140751⟩

  • Article dans une revue

Measure of the temperature-depth profile by an S band radiometric receiver for biomedical applications

S. Bri, L. Zenkouar, A. Saadi, L. Bellarbi, M. Habibi, A. Mamouni

Annals of Telecommunications - annales des télécommunications, 2004, 59, pp.467-484. ⟨hal-00133928⟩

  • Ouvrages

Organic field effect transistors : towards molecular scale

G. Horowitz, F. Biscarini, D. Vuillaume

Elsevier, 177 p., 2004. ⟨hal-00133401⟩

  • Communication dans un congrès

Propagation characteristics in subway tunnels : application to a communication and distance measurement system

M. Lienard, Pierre Degauque, Pierre Laly

2004, pp.240-243. ⟨hal-00142024⟩

  • Article dans une revue

Depth dependence of defect evolution and TED during annealing

B. Colombeau, N.E.B. Cowern, Fuccio Cristiano, P. Calvo, Y. Lamrani, Nikolay Cherkashin, E. Lampin, Alain Claverie

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2004, 216, pp.90-94. ⟨hal-00140976⟩

  • Communication dans un congrès

Reliability of polycrystalline MEMS : prediction of the debugging-time

O. Millet, Pierre Bertrand, Bernard Legrand, D. Collard, L. Buchaillot

International Symposium for Testing and Failure Analysis, ISTFA 2004, 2004, Worcester, MA, United States. ⟨hal-00141030⟩

  • Article dans une revue

Broadband frequency filtering and mode matching using finline technology

T. Decoopman, X. Melique, O. Vanbésien, D. Lippens

Microwave and Optical Technology Letters, 2004, 41, pp.234-7. ⟨hal-00133953⟩