Publications
Affichage de 13851 à 13860 sur 16302
Analysis of right- and left-handed dispersive transmission lines at terahertz frequencies
Jean-Francois Lampin, T. Crepin, M. Perrin, M. Ternisien, L. Desplanque, F. Mollot, D. Lippens
2004, pp.101-102. ⟨hal-00140722⟩
A multi-mode continuously-tunable lowpass filter for zero-IF mobile applications
D. Chamla, A. Kaiser, A. Cathelin, D. Belot
2004, pp.95-98. ⟨hal-00140982⟩
Optimisation and simulation of an alternative nano-flash memory : the SASEM device
Christophe Krzeminski, Emmanuel Dubois, Xing Tang, N. Reckinger, A. Crahay, V. Bayot
2004, pp.45-50. ⟨hal-00140991⟩
Predictive modelling of the fatigue phenomenon for polycristalline structural layers
O. Millet, Pierre Bertrand, Bernard Legrand, D. Collard, L. Buchaillot
2004, pp.145-148. ⟨hal-00141028⟩
RF and noise properties of SOI MOSFETs, including the influence of a direct tunneling gate current
Francois Danneville, G. Pailloncy, Gilles Dambrine, B. Iniguez
2004, pp.103-110. ⟨hal-00154886⟩
Hot carrier aging degradation phenomena in GaN based MESFETs
F. Rampazzo, G. Pierobon, D. Pacetta, Christophe Gaquière, D. Theron, B. Boudart, G. Meneghesso, E. Zanoni
Microelectronics Reliability, 2004, 44, pp.1375-1380. ⟨hal-00154890⟩
Nonlinear ultrasonic phase-conjugate beams and their application in ultrasonic imaging
Andrey Brysev, Leonid Krutyansky, Philippe Pernod, Vladimir L. Preobrazhensky
Acoustical Physics, 2004, 50, pp.623-640. ⟨10.1134/1.1825091⟩. ⟨hal-00162757⟩
Analysis of low frequency drain current noise in AlGaN/GaN HEMTs on Si substrate
N. Malbert, N. Labat, A. Curutchet, A. Touboul, Christophe Gaquière, A. Minko
Fluctuation and Noise Letters, 2004, 4, pp.L319-L328. ⟨hal-00162793⟩
Noise modeling and performance in 0.15 µm fully depleted SOI MOSFET
G. Pailloncy, B. Iniguez, Gilles Dambrine, M. Dehan, J.P. Raskin, H. Matsuhashi, P. Delatte, Francois Danneville
2004, pp.122-130. ⟨hal-00133895⟩