Publications
Affichage de 13871 à 13880 sur 16175
Study by ultrasound of the impact of technological parameters changes in the milk gelation process
Georges Nassar, Bertrand Nongaillard, Y. Noel
Journal of Food Engineering, 2004, 63, pp.229-236. ⟨hal-00142002⟩
Preparation and characterization of conductive polymer/PP composites
B. Kim, V. Konvar, E. Devaux, C. Dufour
Polymer Fibres 2004, 2004, Manchester, United Kingdom. ⟨hal-00140755⟩
Jonctions silicium-molecules-metal par « nanotransfert printing » : synthèse chimique et propriétés électriques
C. Merckling, David Guérin, S. Lenfant, D. Vuillaume
Journées Nationales du GDR Nanoélectronique, 2004, Aussois, France. ⟨hal-00140746⟩
Transport electronique dans les nanostructures organiques
D. Vuillaume
1ère Rencontre Grenobloise d'Electronique Moléculaire, 2004, Grenoble, France. ⟨hal-00140774⟩
Charge transport in DNA
T. Heim, Thierry Melin, D. Deresmes, D. Vuillaume
5th International Symposium on MEMS and Nanotechnology, 2004, Costa Mesa, CA, United States. ⟨hal-00140750⟩
Silicon-molecules-metal junctions by nanotransfer printing
C. Merckling, David Guérin, S. Lenfant, D. Vuillaume
European Conference on Organized Films, ECOF 2004, 2004, Valladolid, Spain. ⟨hal-00140759⟩
Low-loss InGaAsP/InP submicron optical waveguides fab ricated by ICP etching
Samuel Dupont, Arnaud Beaurain, Patrice Miska, Malek Zegaoui, Jean-Pierre Vilcot, Hongwu Li, M. Constant, Didier Decoster, Jean Chazelas
Electronics Letters, 2004, 40(14), pp.865-866. ⟨10.1049/el:20040502⟩. ⟨hal-00270000⟩
Interpretation and reconstruction of Sadi Carnot’s Réflexions through original sentences belonging to non–classical logic
Antonino Drago, Raffaele Pisano
Atti della Fondazione Ronchi, 2004, LIX (5), pp.615-644. ⟨hal-04508054⟩
Using low frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction
Jean-Guy Tartarin, Geoffroy Soubercaze-Pun, Abdelali Rennane, Laurent Bary, Jean-Claude de Jaeger, Marie Germain, S. Delage, Robert Plana, Jacques Graffeuil
Using low frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction . 2004, pp.296-306. ⟨hal-00141968⟩
Reliability investigation of gallium nitride HEMT microelectronics reliability
A. Sozza, C. Dua, E. Morvan, B. Grimbert, Virginie Hoel, S.L. Delage, N. Chaturvedi, R. Lossy, J. Wuerfl
Microelectronics Reliability, 2004, 44, pp.1369-1373. ⟨hal-00141958⟩