Publications
Affichage de 13891 à 13900 sur 16175
Current instabilities and deep level investigation on AlGaN/GaN HEMT's on silicon and sapphire substrates
N. Sghaier, N. Yacoubi, J.M. Bluet, A. Souifi, G. Guillot, Christophe Gaquière, Jean-Claude de Jaeger
2004, pp.672-675. ⟨hal-00154889⟩
Conception, réalisation et caractérisation d'un système de télécommunication par faisceau hertzien à la fréquence de 7.1 GHz
P. Delemotte, Jean-François Legier, Gilles Dambrine, H. Happy
8èmes Journées Pédagogiques du CNFM, 2004, Saint Malo, France. ⟨hal-00133904⟩
Noise and large-signal characterization of a thin-film MHEMT feedback amplifier in multilayer MCM-D technology
R. Vandersmissen, D. Schreurs, Gilles Dambrine, G. Carchon, G. Borghs
2004, 8.14, 4p. ⟨hal-00133914⟩
Radiometric sensor for temperature control of food processing
V. Thomy, Luc Dubois, C. Vanoverschelde, J.P. Sozanski, J. Pribetich
IEEE Sensors Journal, 2004, 4, pp.772-778. ⟨hal-00133930⟩
Imagerie à 35 GHz de défauts au sein de matériaux diélectriques
M. Maazi, D. Glay, T. Lasri
2004, pp.Session 10. ⟨hal-00142051⟩
Near-field levitation generated by ultrasonic vibrations : theoretical analysis and experiments
Anne-Christine Hladky, C. Granger, G. Haw, Bertrand Dubus
2004, pp.623-624. ⟨hal-00142046⟩
Photonic band gap materials
D. Lippens
28th Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe, WOCSDICE'04, 2004, Smolenice, Slovakia. ⟨hal-00133957⟩
As–P interface-sensitive GaInP/GaAs structures grown in a production MBE system
S. Dhellemmes, S. Godey, A. Wilk, X. Wallart, F. Mollot
Proceedings of the 13th International Conference on Molecular Beam Epitaxy, MBE XIII, 2004, Edinburgh, Scotland, United Kingdom. ⟨hal-00142073⟩
Transmission Electron Microscopy analysis of MOSFET structures
A. Laszcz, J. Katcki, J. Ratajczak, Emmanuel Dubois, G. Larrieu, X. Wallart, Xing Tang
School on Materials Science and Electron Microscopy, Emerging Microscopy for Advanced Materials Development-Imaging and Spectroscopy on Atomic Scale, 2004, Berlin, Germany. ⟨hal-00140997⟩
Impact of downscaling on high-frequency noise performance of bulk and SOI MOSFETs
G. Pailloncy, C. Raynaud, M. Vanmackelberg, Francois Danneville, Sylvie Lepilliet, J.P. Raskin, Gilles Dambrine
IEEE Transactions on Electron Devices, 2004, 51, pp.1605-1612. ⟨hal-00133871⟩