Publications

• Communication dans un congrès

Advanced and nanometric MOSFET architecture, multiple gate devices and Pi gates

J. Penaud, F. Fruleux, Emmanuel Dubois, G. Larrieu

MIGAS International Summer School on Advanced Microelectronics, MIGAS'04, 2004, Autrans, France. ⟨hal-00140995⟩

• Communication dans un congrès

High indium content pseudomorphic InGaAs layers for high mobility heterostructures on InP(001)

X. Wallart, B. Pinsard, F. Mollot

Proceedings of the 13th International Conference on Molecular Beam Epitaxy, MBE XIII, 2004, Edinburgh, Scotland, United Kingdom. ⟨hal-00142074⟩

• Communication dans un congrès

Non-linear modeling of the kink effect in deep sub-micron SOI MOSFET

A. Siligaris, Gilles Dambrine, Francois Danneville

2004, pp.47-50. ⟨hal-00133900⟩

• Autre publication scientifique

Simulation Monte Carlo du transport quantique dans les composants nanométriques. Application à l'étude de lasers à cascade quantique térahertz

Olivier Bonno

2004. ⟨hal-00133931⟩

• Article dans une revue

Raman characterization of Mg+ ion-implanted GaN

B. Boudart, Y. Guhel, J. C. Pesant, P. Dhamelincourt, M. A. Poisson

Mg+ ions were implanted at room temperature in n-type hexagonal GaN for the device isolation purposes. The implantation dose varied from 7.5 × 1012 to 1016 ions cm−2. We performed resonance Raman spectroscopy and DC electrical measurements in order to monitor the structural and electrical changes…

Journal of Physics: Condensed Matter, 2003, 16 (2), pp.S49. ⟨10.1088/0953-8984/16/2/006⟩. ⟨hal-02936052⟩

• Thèse

Gravure par faisceau d'ions de films minces de titano-zirconate de plomp (PZT) : étude des dégradations engendrées et contribution à l'intégration aux microsystèmes, Ion beam etching of lead titanate-zirconate (PZT) thin films : study of damages induced and contribution to the integration in microsystems

Caroline Soyer

Ces travaux, relatifs à la gravure par faisceau d'ions de films minces de PZT, présentent un ensemble de résultats pouvant être scindés en deux parties. Tout d'abord, nous avons mené une étude originale dont le but est de tenter d'appréhender les mécanismes d'interactions entre…, First of all, we have carried out an original study of which the aim is to try to understand the mechanisms of interactions between an ion beam (reactive or not) and the PZT surface. We have underlined various degradations of material, as well microstructural as electrical. These damages evolve…

Electronique. Université de Valenciennes et du Hainaut-Cambrésis, 2003. Français. ⟨NNT : 2003VALE0038⟩. ⟨hal-00162746⟩

• Pré-publication, Document de travail

Dispersive charge transport along the surface of an insulating layer observed by Electrostatic Force Microscopy

J. S. Lambert, G. de Loubens, C. Guthmann, M. Saint-Jean, Thierry Melin

We report the observation in the direct space of the transport of a few thousand charges submitted to atunable electric field along the surface of a silicon oxide layer. Charges are both deposited and observedusing the same Electrostatic Force Microscope. During the time range accessible to our…

2003. ⟨hal-00000962⟩

• Article dans une revue

Two-dimensional microfabricated sources for nanoelectrospray

Séverine Le Gac, S. Arscott, Cécile Cren-Olivé, Christian Rolando

Journal of Mass Spectrometry, 2003, 38 (12), pp.1259-1264. ⟨10.1002/jms.580⟩. ⟨hal-02347837⟩

• Chapitre d'ouvrage

Chapter 6 - Structural health monitoring evaluation tests

P. Lloyd, R. Pressland, J. Mcfeat, I. Read, P. Foote, J.P. Dupuis, E. O'Brien, L. Reithler, Sébastien Grondel, Christophe Delebarre, K. Levin, C. Boller, C. Biemans, W. Staszewski

STASZEWSKI W., BOLLER C., TOMLINSON G.R. Health monitoring of aerospace structures : smart sensor technologies and signal processing, John Wiley & Sons, pp.207-260, 2003. ⟨hal-00131715⟩

• Article dans une revue

Transmission and filtering in photonic circuits: effects of absorption and amplification

B. Djafari-Rouhani, E.H. El Boudouti, Abdellatif Akjouj, J.O. Vasseur, Leonard Dobrzynski

Progress in Surface Science, 2003, 74 (1-8), pp.389-404. ⟨10.1016/j.progsurf.2003.08.030⟩. ⟨hal-04070821⟩