Publications
Affichage de 14221 à 14230 sur 16181
Non-linear phenomenological model for RF advanced MOSFET
A. Siligaris, Gilles Dambrine, Sylvie Lepilliet, D. Schreurs, Francois Danneville
European IC-CAP User Meeting, 2003, Prague, Czech Republic. ⟨hal-00146016⟩
Caractérisation électro-opique de composants térahertz par échantillonnage Franz-Keldysh subpicoseconde
L. Desplanque
2003. ⟨hal-00146113⟩
Experimental and theoretical investigation of the GaInAs surface reactivity to phosphorus
X. Wallart, C. Priester
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2003, 68, pp.235314/1-10. ⟨hal-00146112⟩
Influence of growth conditions on the structural, optical and electrical quality of MBE grown InAlAs/InGaAs metamorphic HEMTs on GaAs
Yvon Cordier, P. Lorenzini, Jean Michel Chauveau, D. Ferré, Ydir Androussi, J. Dipersio, Dominique Vignaud, Jean-Louis Codron
International Conference on Molecular Bean Epitaxy, Sep 2002, San Francisco, CA, United States. pp.822-826, ⟨10.1109/MBE.2002.1037764⟩. ⟨hal-00146110⟩
Optimisation and modelling of pentacene-based organic thin film on high-k gate dielectrics
K. Lmimouni, M. Berliocchi, C. Dufour, Denis Remiens, D. Vuillaume, G. Velu, C. Legrand
7th European Conference on Molecular Electronics, ECME 2003, 2003, Avignon, France. ⟨hal-00146178⟩
Self-assembled molecular rectifying diodes on silicon : synthesis, experimental and theoretical charge transport studies
Stéphane Lenfant, Dominique Vuillaume, Christophe Krzeminski, Guy Allan, Christophe Delerue, F. Tran Van, C. Chevrot
7th European Conference on Molecular Electronics, ECME 2003, Sep 2003, Avignon, France. ⟨hal-00146179⟩
2½ D microfabricated nib-like sources for nanoelectrospray applications
S. Le Gac, S. Arscott, C. Rolando
2003, pp.1211-1214. ⟨hal-00146442⟩
Influence on the step covering on fatigue phenomenon for polycrystalline silicon MEMS
O. Millet, Bernard Legrand, D. Collard, L. Buchaillot
Japanese Journal of Applied Physics, 2003, 41, pp.L1339-L1341. ⟨hal-00146435⟩
Feedback of MEMS reliability study on the design stage : a step toward reliability aided design (RAD)
L. Buchaillot
Microelectronics Reliability, 2003, 43, pp.1919-1928. ⟨hal-00146437⟩
Low-frequency drain noise in AlGaN/GaN HEMTs on Si substrate
N. Malbert, N. Labat, A. Curutchet, A. Touboul, Christophe Gaquière, A. Minko
2003, pp.342-349. ⟨hal-00162738⟩