Publications
Affichage de 14231 à 14240 sur 16083
What are the limiting parameters of deep-submicron MOSFETs for high frequency applications ?
Gilles Dambrine, C. Raynaud, D. Lederer, M. Dehan, O. Rozeaux, M. Vanmackelberg, Francois Danneville, Sylvie Lepilliet, J.P. Raskin
IEEE Electron Device Letters, 2003, 24, pp.189-191. ⟨hal-00145984⟩
Impact of down scaling on high frequency noise performance of bulk and SOI MOSFETs
Gilles Dambrine, C. Raynaud, M. Vanmackelberg, Francois Danneville, G. Pailloncy, Sylvie Lepilliet, J.P. Raskin
SPIE Fluctuations and Noise Symposium, Noise in Devices and Circuits, 2003, Sante Fe, NM, United States. ⟨hal-00146001⟩
Strong effect of interband transitions in the picosecond ultrasonics response of metallic thin films
Arnaud Devos, A. Le Louarn
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2003, 68, pp.045405/1-6. ⟨10.1103/PhysRevB.68.045405⟩. ⟨hal-00144884⟩
Long-range transport in an assembly of ZnO quantum dots : the effects of quantum confinement, Coulomb repulsion and structural disorder
Aarnoud L. Roest, Alexander Germeau, John J. Kelly, Daniel Vanmaekelbergh, Guy Allan, Eric A. Meulenkamp
ChemPhysChem, 2003, 4, pp.959-966. ⟨10.1002/cphc.200300696⟩. ⟨hal-00146618⟩
A post-processor for reducing temporal busyness in low-bit-rate applications
François-Xavier Coudoux, Marc G. Gazalet, Patrick Corlay
Signal Processing: Image Communication, 2003, 18, pp.455-463. ⟨hal-00146716⟩
Les microtechnologies et les microsystèmes : donnez du mouvement à la microélectronique
L. Buchaillot
Journée des électroniciens, 2003, Obernai, France. ⟨hal-00146458⟩
Guided wave techniques for optical characterization of lead based ferroelectrics
El Hadj Dogheche, X. Lansiaux, Denis Remiens
REMIENS D. Recent research developments in piezoelectric materials for macro/micro systems, Research Signpost, Kerala, India, pp.211-235, 2003. ⟨hal-00132004⟩
An experimental and theoretical investigation of the GaInAs surface reactivity to phosphorus
X. Wallart, C. Priester
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2003, 68, pp.235314. ⟨hal-00018497⟩
Caractérisation d'objets enfouis - Estimation du coefficient de réflexion
Latifa Achrait-Furlan, T. Lasri, Ahmed Mamouni
Actes de TELECOM 03 et 3èmes Journées Franco-Maghrébines des Microondes et leurs Applications, JFMMA 2003, 2003, Marrakech, Maroc. pp.1D-20. ⟨hal-00146066⟩
Modélisation de bruit pour des MOSFETs SOI 0,25 microns totalement désertés
G. Pailloncy, B. Iniguez, J.P. Raskin, Gilles Dambrine, Francois Danneville
2003, pp.6A-3. ⟨hal-00146010⟩