Publications
Affichage de 14271 à 14280 sur 16064
What are the limiting parameters of deep-submicron MOSFETs for high frequency applications ?
Gilles Dambrine, C. Raynaud, D. Lederer, M. Dehan, O. Rozeaux, M. Vanmackelberg, Francois Danneville, Sylvie Lepilliet, J.P. Raskin
IEEE Electron Device Letters, 2003, 24, pp.189-191. ⟨hal-00145984⟩
Impact of down scaling on high frequency noise performance of bulk and SOI MOSFETs
Gilles Dambrine, C. Raynaud, M. Vanmackelberg, Francois Danneville, G. Pailloncy, Sylvie Lepilliet, J.P. Raskin
SPIE Fluctuations and Noise Symposium, Noise in Devices and Circuits, 2003, Sante Fe, NM, United States. ⟨hal-00146001⟩
Influence of residual air gaps on the characteristics of circular polarization aperture-coupled millimeter wave microstrip antennas
Ronan Sauleau, Philippe Coquet
Electronics Letters, 2003, 39 (12), pp.889-891. ⟨hal-00549359⟩
Radiation characteristics and performances of millimeter wave horn-fed gaussian beam antennas
Ronan Sauleau, Philippe Coquet, Daniel Thouroude, J.P. Daniel, T. Matsui
IEEE Transactions on Antennas and Propagation, 2003, 51 (3), pp.378-387. ⟨hal-00549357⟩
Beam focusing using 60-GHz Fabry-Perot resonators with uniform and non-uniform metal grids
Ronan Sauleau, Philippe Coquet, Daniel Thouroude, J.P. Daniel
Electronics Letters, 2003, 39 (4), pp.341-342. ⟨hal-00549353⟩
Les microtechnologies et les microsystèmes : donnez du mouvement à la microélectronique
L. Buchaillot
Journée des électroniciens, 2003, Obernai, France. ⟨hal-00146458⟩
Evolution de caractéristiques statiques de HEMTs AlGaN/GaN soumis à un stress électrique réalisé à différentes températures
B. Boudart, Jean-François Llibre, D. Briand, Boubekeur Tala-Ighil, H. Toutah, Yannick Guhel, Jean-Claude de Jaeger, Z. Bougrioua, Marianne Germain, Ingrid Moerman
13es Journées Nationales Microondes, 2003, Lille, France. ⟨hal-01654259⟩
Grazing incidence diffraction anomalous fine structure : a tool for investigating strain distribution and interdiffusion in InAs/InP quantum wires
A. Letoublon, Hubert Renevier, M.G. Proietti, C. Priester, M.L. Gonzalez, J.M. Garcia
2003, pp.541-542. ⟨hal-00149938⟩
Electric force microscopy of individually charged semiconductor nanoparticles
Thierry Melin, H. Diesinger, D. Deresmes, D. Stievenard
Materials Research Society Fall Meeting, 2003, Boston, MA, United States. ⟨hal-00146615⟩
Strong effect of interband transitions in the picosecond ultrasonics response of metallic thin films
Arnaud Devos, A. Le Louarn
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2003, 68, pp.045405/1-6. ⟨10.1103/PhysRevB.68.045405⟩. ⟨hal-00144884⟩