Publications
Affichage de 14331 à 14340 sur 16237
Giant magnetostriction nanostructures for actuation of microsystems
Philippe Pernod, Vladimir Preobrazhensky
2003, pp.7. ⟨hal-00146135⟩
Self-assembled monolayers and molecular-scale electronics
D. Vuillaume
Nano et micro technologies, 2003, 3, pp.35-57. ⟨hal-00146157⟩
Electronic and optical approach for generation in the terahertz gap
D. Lippens
3rd ESA Workshop on Millimeter Wave Technology and Applications, 2003, Helsinki, Finland. ⟨hal-00146090⟩
Injection contrôlée de charges dans des nanoparticules individuelles de silicium
H. Diesinger, Thierry Melin, D. Deresmes, D. Stievenard
Forum des microscopies à sonde locale, 2003, Montpellier, France. ⟨hal-00146612⟩
Grazing incidence diffraction anomalous fine structure of self-assembled semiconductor nanostructures
S. Grenier, A. Letoublon, M.G. Proeitti, Hubert Renevier, L. Gonzalez, J.M. Garcia, C. Priester, J. Garcia
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2003, 200, pp.24-33. ⟨hal-00146613⟩
Low frequency noise behaviour in AlGaN/GaN HEMT's
Abdelali Rennane, Laurent Bary, Jean-Guy Tartarin, Y. Guhel, Christophe Gaquière, Jean-Claude de Jaeger, Z. Bougrioua, S. Delage, Jacques Graffeuil, Robert Plana
12th European Workshop on Heterostructure Technology, heTech 2003, 2003, San Rafael, Spain. ⟨hal-00146693⟩
Optimisation des HEMTs AlGaN/GaN/Si
A. Minko, Virginie Hoel, Jean-Claude de Jaeger, Y. Cordier, F. Semond, F. Natali, J. Massies
2003, pp.1D-12. ⟨hal-00146697⟩
Novel dual-mode structures
S. Garidel, Jean-Pierre Vilcot, Didier Decoster, M. Muller, M. Francois
First European NEFERTITI Winterschool on Microwave and Optoelectronics Devices and Systems, 2003, Winterberg, Germany. ⟨hal-00146583⟩
Nouvelles structures laser pour émission bimode
S. Garidel, Jean-Pierre Vilcot, Didier Decoster, M. Francois, M. Muller
Actes de TELECOM 03 et 3èmes Journées Franco-Maghrébines des Microondes et leurs Applications, JFMMA 2003, 2003, Marrakech, Maroc. ⟨hal-00146536⟩
Techniques for mechanical strain analysis in submicron structures : TEM/CBED, micro-Raman spectroscopy, X-RAY micro-diffraction and modelling
I. de Wolf, V. Senez, R. Balboni, A. Armigliato, S. Frabboni, A. Cedola, S. Lagomarsino
Microelectronic Engineering, 2003, 70, pp.425-435. ⟨hal-00146410⟩