Publications
Affichage de 14501 à 14510 sur 16382
Impact of down scaling on high frequency noise performance of bulk and SOI MOSFETs
Gilles Dambrine, C. Raynaud, M. Vanmackelberg, Francois Danneville, G. Pailloncy, Sylvie Lepilliet, J.P. Raskin
SPIE Fluctuations and Noise Symposium, Noise in Devices and Circuits, 2003, Sante Fe, NM, United States. ⟨hal-00146001⟩
An electromechanical ring lead zirconate titanate (PZT) actuator used as a spring
J.C. Debus, M. Lippert, Anne-Christine Hladky, M. Brussieux
2003 US Navy Workshop on Acoustic Transduction Materials and Devices, 2003, State College, PA, United States. ⟨hal-00145965⟩
What are the limiting parameters of deep-submicron MOSFETs for high frequency applications ?
Gilles Dambrine, C. Raynaud, D. Lederer, M. Dehan, O. Rozeaux, M. Vanmackelberg, Francois Danneville, Sylvie Lepilliet, J.P. Raskin
IEEE Electron Device Letters, 2003, 24, pp.189-191. ⟨hal-00145984⟩
Path delay model based on stable distribution for the 60GHz indoor channel
N. Azzaoui, Laurent Clavier, R. Sabre
IEEE GLOBECOM, 2003, pp.441-467. ⟨hal-01077681⟩
Coupling of atom-by-atom calculations of extended defects with B kick-out equations : application to the simulation of boron TED
E. Lampin, Fuccio Cristiano, Y. Lamrani, Bernard Colombeau
European Materials Research Society Spring Meeting, 2003, Strasbourg, France. ⟨hal-00146423⟩
Phase conjugation of second acoustic harmonics. Retrofocusing in nonlinear inhomogeneous medium
Vladimir Preobrazhensky, Philippe Pernod
Ultrasonics International, 2003, Granada, Spain. ⟨hal-00146150⟩
Self-assembled molecular rectifying diodes
S. Lenfant, D. Vuillaume, Christophe Krzeminski, C. Delerue
Materials Research Society Spring Meeting, 2003, San Francisco, CA, United States. ⟨hal-00146173⟩
Protéomique intégrée
S. Arscott, S. Le Gac, C. Druon, P. Tabourier, C. Rolando
Journées Nationales du Réseau Micro et Nano Technologies, 2003, Lille, France. ⟨hal-00146396⟩
Transmission electron microscopy of iridium silicide contacts for advanced MOSFET structures with Schottky source and drain
A. Laszcz, J. Katcki, J. Ratajczak, G. Larrieu, Emmanuel Dubois, X. Wallart
European Materials Research Society Fall Meeting, 2003, Warsaw, Poland. ⟨hal-00146424⟩
Modeling of failure mechanisms for optimized MEMS CAD : design, fabrication and characterization of in situ test benches
Olivier Millet, Vincent Agache, Bernard Legrand, Dominique Collard, Lionel Buchaillot
12th International Conference on Solid-State Sensors, Jun 2003, Boston, United States. pp.1578-1581, ⟨10.1109/SENSOR.2003.1217081⟩. ⟨hal-00146440⟩