Publications
Affichage de 14891 à 14900 sur 16279
Modélisation numérique et caractérisation expérimentale du champ de cavitation ultrasonore
P. Mosbah, Bertrand Dubus, O. Ledez, C. Campos-Pozuelo, C. Granger
2002, pp.747-750. ⟨hal-00147777⟩
Fast electromagnetic characterization method of film-shaped materials using coplanar up to V-band
J. Hinojosa, K. Lmimouni, Gilles Dambrine
Electronics Letters, 2002, 38, pp.373-374. ⟨hal-00147838⟩
Solid-state 8 GHz transient signal digitizer characterization
A. Ghis, P. Ouvrier-Buffet, N. Rolland, A. Benlarbi-Delai, P.A. Rolland, D. Glay, D. Jaeger
2002, pp.1673-1676. ⟨hal-00148329⟩
Multiple parallel conduction paths observed in depth-profiled n-GaN epilayers
C. Mavroidis, J. Harris, R. Jackman, I. Harrison, B. Ansell, Z. Bougrioua, I. Moerman
Journal of Applied Physics, 2002, 91 (12), pp.9835. ⟨10.1063/1.1477604⟩. ⟨hal-02906594⟩
Fabrication of a pMUT using silicon bulk micromachining and a sputtered PZT layer
W. Daniau, Karim Dogheche, S. Ballandras, Eric Cattan, Denis Remiens, W. Steichen, P. Blind
Proc. of the 2nd WorkShop on MUT, Besançon, 2002, pp. june. ⟨hal-00123195⟩
Microwave technique for detection, location and sizing of buried objects
Latifa Achrait-Furlan, T. Lasri, Ahmed Mamouni
Microwave and Optical Technology Letters, 2002, 32 (2), pp.145-149. ⟨10.1002/mop.10115⟩. ⟨hal-00147852⟩
Piezoelectric properties of sputtered PZT films: influence of structure, microstructure, film thickness, (Zr,Ti) ratio and Nb substitution
Denis Remiens, Eric Cattan, Caroline Soyer, T. Haccart
European Materials Research Society Spring Meeting, Symposium P, Advanced Materials for Microelectronics : Ferroelectrics and Low-k Dielectrics, 2002, France. pp.123-127. ⟨hal-00250393⟩
Interactions entre les ultrasons et les matrices fromagères
Georges Nassar, Bertrand Nongaillard, C. Achilleos, L. Tessier, Y. Noel
7ème Colloque PROSETIA, Procédés de Séparation et de Transformation dans les Industries Agroalimentaires, 2002, Compiègne, France. ⟨hal-00149925⟩
High-frequency high-Q micro-mechanical resonators in thick epipoly technology with post-process gap adjustment
D. Galayko, A. Kaiser, Bernard Legrand, C. Combi, D. Collard, L. Buchaillot
2002, pp.665-668. ⟨hal-00148737⟩
Reliability of polysilicon microstructures : in situ test benches
O. Millet, D. Collard, L. Buchaillot
Microelectronics Reliability, 2002, 42, pp.1795-1800. ⟨hal-00148766⟩