Publications
Affichage de 15051 à 15060 sur 16385
Stress field evaluation by Barkhausen noise on bearing raceway
S. Desvaux, J. Gualandri, Marc Duquennoy, Mohamed Ourak
2002, pp.1585-1590. ⟨hal-00149912⟩
Thick LiNnO3 layers on diamond-coated silicon for surface acoustic wave filters
El Hadj Dogheche, Véronique Sadaune, X. Lansiaux, Denis Remiens, Tadeusz Gryba
Applied Physics Letters, 2002, 81, pp.1329-1331. ⟨hal-00149631⟩
Characterization of mems devices using a polarisation interferometer
D. Jenkins, W. Clegg, X. Liu, E. Fribourg-Blanc, Eric Cattan
Integrated Ferroelectrics, 2002, 50, pp.91-99. ⟨hal-00149626⟩
Propriétés optiques des nanostructures de Si
Christophe Delerue, Guy Allan, Michel Lannoo
VIII Journées de la Matière Condensée, 2002, Marseille, France. ⟨hal-00149681⟩
Confinement effects and tunneling through quantum dots
Michel Lannoo, Christophe Delerue, Guy Allan, Yann-Michel Niquet
Symposium of Royal Society, 2002, London, United Kingdom. ⟨10.1098/rsta.2002.1127⟩. ⟨hal-00149686⟩
Isolation de transistors dans la filière nitrure de gallium par implantation d'argon
Y. Guhel, J.C. Pesant, Jean-Claude de Jaeger, B. Boudart, P. Dhamelincourt, M.A. Poisson
9èmes Journées Nationales Microélectronique et Optoélectronique, JNMO 2002, 2002, Saint Aigulf, France. ⟨hal-00149716⟩
Amélioration de la parole et détection d'activité vocale dans les systèmes de télécommunications mobiles
Bendjima Brahim
2002. ⟨hal-00149732⟩
Univariant assessment of the quality of images
M. Jung, D. Leger, Marc G. Gazalet
Journal of Electronic Imaging, 2002, 11, pp.354-364. ⟨hal-00149735⟩
Reliability of GaN based devices
G. Meneghesso, Christophe Gaquière, E. Zanoni
Proceedings of the 2002 European Microwave Week, 2002, Milano, Italy. ⟨hal-00149728⟩
Large signal behaviour of gallium nitride based HEMT's devices
Christophe Gaquière, Raphaël Aubry, Yannick Guhel, A. Minko, Nicolas Vellas, Matthieu Werquin, B. Boudart, Simone Cassette, Yvon Cordier, Sylvain Laurent Delage, E. Delos, Jean-Claude de Jaeger, Damien Ducatteau, H. Gerard
25th Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe, WOCSDICE 2002, 2002, Chermogolovska, Russia. ⟨hal-00149730⟩