Publications
Affichage de 15161 à 15170 sur 16104
Silicon nitride as an effective protection against oxidation of a TiNi thin film in high temperature oxidizing air environment at atmospheric pressure
I. Roch, L. Buchaillot, X. Wallart, D. Collard
Journal of Vacuum Science and Technology, 2001, B19, pp.305-307. ⟨hal-00152461⟩
Combined polarizing interferometer and optical beam deflection system for MEMS characterization
D.F.L. Jenkins, W.W. Clegg, X. Liu, G. Tunstall, Eric Cattan, Denis Remiens, B. Liu
2001, pp.15-25. ⟨hal-00152485⟩
Etude par EFM de la charge/décharge d'îlots semiconducteurs de taille nanométrique
Thierry Melin, D. Deresmes, D. Stievenard
Journées d'utilisateurs nanoscope, 2001, Dijon, France. ⟨hal-00152560⟩
Noncontact microwave material characterization
D. Glay, T. Lasri, A. Mamouni, Y. Leroy
Subsurface and Surface Sensing Technologies and Applications III, 2001, San-Diego, CA, United States. ⟨hal-00152057⟩
Compound statistical model for 60GHz indoor channel
Y. Delignon, Laurent Clavier, V. Le Thuc, C. Garnier, M. Rachdi
2001, pp.1780-1784. ⟨hal-00152036⟩
Free space moisture profile measurement
D. Glay, T. Lasri, A. Mamouni, Y. Leroy
2001, pp.235-242. ⟨hal-00152034⟩
Etudes technologiques, expérimentales et par simulation pour la commutation optique sur InP
Y. Hernandez
2001. ⟨hal-00152491⟩
Multifrequency parametric phase conjugation of ultrasound beams in magnetic ceramics
L. Krutyyansky, Philippe Pernod, Vladimir Preobrazhensky
IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control, 2001, 48, pp.609-612. ⟨hal-00152094⟩
Réactivation par injection électronique des donneurs Si dans le GaAs hydrogéné ou deutéré
S. Silvestre, L. Kurowski, D. Bernard-Loridant, E. Constant, B. Grandidier, Thierry Melin, J.P. Nys, D. Stievenard, Jacques Chevallier
8èmes Journées Nationales Microélectronique et Optoélectronique, JNMO 2001, 2001, Aussois, France. ⟨hal-00152537⟩
Ultrasonic harmonic imaging by means of supercritical parametric
Leonid Krutyansky, Philippe Pernod, Andrey Brysev, Vladimir Preobrazhensky
Ultrasonics International, 2001, Delft, Netherlands. ⟨hal-00152129⟩