Publications
Affichage de 15251 à 15260 sur 16182
Etude par EFM de la charge/décharge d'îlots semiconducteurs de taille nanométrique
Thierry Melin, D. Deresmes, D. Stievenard
Journées d'utilisateurs nanoscope, 2001, Dijon, France. ⟨hal-00152560⟩
Noncontact microwave material characterization
D. Glay, T. Lasri, A. Mamouni, Y. Leroy
Subsurface and Surface Sensing Technologies and Applications III, 2001, San-Diego, CA, United States. ⟨hal-00152057⟩
Directivity of integrated piezoelectric Lamb wave sources
Emmanuel Moulin, Nicolas Bourasseau, Jamal Assaad, Christophe Delebarre
2001 IEEE Ultrasonics Symposium. Proceedings. An International Symposium, Oct 2001, Atlanta, GA, United States. pp.1081-1084, ⟨10.1109/ULTSYM.2001.991907⟩. ⟨hal-00152941⟩
Non destructive evaluation of cell adhesion by ultrasounds
A. Myrdycz, Dorothée Debavelaere-Callens, K. Kot, F. Monchau, E. Radiszewski, A. Lefebvre, F. Hildebrand
2001, pp.G-IV.2. ⟨hal-00152938⟩
Numerical modeling, experimental investigations and stress control for flat glass tempering
E. Romero, Dominique Lochegnies, Marc Duquennoy
2001, pp.242-247. ⟨hal-00152939⟩
Perfect multi-user interference cancellation in synchronous MC-CDMA systems in rayleigh fading channels
M. Bouziani, A. Djebbari, J.M. Belbachir, Jean-Michel Rouvaen
INPT, 2001, -, Morocco. pp.112-116. ⟨hal-00152935⟩
Nondestructive permittivity profile retrieval of non-planar objects by free space microwave techniques
D. Glay, T. Lasri, A. Mamouni
Subsurface Sensing Technologies and Applications, 2001, 2, pp.391-409. ⟨hal-00152022⟩
Conception et réalisation d'un système d'imagerie passive en temps réel à détection directe en gamme millimétrique
A. Chams Eddine
2001. ⟨hal-00152017⟩
Combined polarizing interferometer and optical beam deflection system for MEMS characterization
D.F.L. Jenkins, W.W. Clegg, X. Liu, G. Tunstall, Eric Cattan, Denis Remiens, B. Liu
2001, pp.15-25. ⟨hal-00152485⟩