Publications

Affichage de 15281 à 15290 sur 16064


  • Article dans une revue

A MEMS oriented distributed processor for integrated feed-back controller

Y. Mita, A. Kaiser, Patrick Garda, M. Milgram, H. Fujita

Electronics and Communications in Japan, Part 2 : Electronics, 2000, 83, pp.48-55. ⟨hal-00158498⟩

  • Communication dans un congrès

Design and realization of sub-100 nm gate length HEMTs

T. Parenty, S. Bollaert, J. Mateos-Lopez, A. Cappy

10th European Workshop on Heterostructure Technology, heTech'00, Sep 2000, Günzburg, Germany. ⟨hal-00157904⟩

  • Article dans une revue

Substrate transfer process for InP-based heterostructure barrier varactor devices

S. Arscott, P. Mounaix, D. Lippens

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures, 2000, 18 (1), pp.150. ⟨10.1116/1.591167⟩. ⟨hal-02348017⟩

  • Communication dans un congrès

Deformable magnetic mirror for adaptive optics: first results

O. Cugat, P. Mounaix, Skandar Basrour, C. Divoux, G. Reyne

An alternative approach to compact deformable mirrors for adaptive optics is developed. A prototype of a two inch mirror composed of a thin polymer membrane covered with a matrix of permanent magnets and an array of microcoils was built. Several complementary modelling tools were used to study the…

Proceedings IEEE Thirteenth Annual International Conference on Micro Electro Mechanical Systems (Cat. No.00CH36308), 2000, Miyazaki, Japan. pp.485-90, ⟨10.1109/MEMSYS.2000.838475⟩. ⟨hal-00008672⟩

  • Communication dans un congrès

Design and testing of Langevin type transducers with PMN-PT-La (90-10-1%) ceramics

J. Coutte, J.C. Debus, Bertrand Dubus, C. Granger

US Navy Workshop on Acoustic Transduction Materials and Devices, 2000, State College, United States. ⟨hal-00157835⟩

  • Communication dans un congrès

Comparison of microwave performances for fully and partially depleted sub-quarter micron SOI MOSFETs

M. Goffioul, Gilles Dambrine, D. Vanhoenacker, J.P. Raskin

Proceedings of the 5th Symposium on Diagnostics and Yield : SOI-Materials, Devices and Characterization, D&Y'2000, 2000, Warsaw, Poland. ⟨hal-00157893⟩