Publications

• Autre publication scientifique

Microélectronique et microtechnologies des composants III-V. Applications aux longueurs d'onde millimétrique et submillimétrique

P. Mounaix

2000. ⟨hal-00158226⟩

• Communication dans un congrès

Visualisation des ondes Ao, So, A1, S1 et A sur une plaque métallique immergée

L. Derbesse, Philippe Pernod, V. Latard, A. Merlen

2000, pp.92-94. ⟨hal-00158457⟩

• Communication dans un congrès

On 2D/3D numerical oxidation modeling : calibration and investigation of silicon crystal orientation effect on stresses in shallow trench isolations

T. Hoffmann, K.F. Dombrowski, V. Senez

2000, pp.59-62. ⟨hal-00158513⟩

• Communication dans un congrès

Optical to millimeter-waves transducers

Jean-Pierre Vilcot

Microwave Photonic Devices and Systems, 2000, Grasmere, France. ⟨hal-00158621⟩

• Autre publication scientifique

Structure électronique et propriétés thermoélectriques des skudttérudites

M. Lassalle

2000. ⟨hal-00158639⟩

• Communication dans un congrès

Signal to noise ratio enhancement using heterojunction bipolar phototransistor by base current compensation

Samuel Dupont, M. Fendler, F. Jorge, Sophie Maricot, Jean-Pierre Vilcot, Didier Decoster

2000, pp.59-61. ⟨hal-00158601⟩

• Communication dans un congrès

Fast photodetection

Jean-Pierre Vilcot, Joseph Harari, M. Fendler, V. Magnin, Samuel Dupont, Didier Decoster

3rd European Microwave Week, Workshop on Microwave Optoelectronics, 2000, Paris, France. ⟨hal-00158617⟩

• Article dans une revue

Measurement of residual phase noise of frequency divider using a single divider technique

V. Brugidou, Paul-Alain Rolland

A new technique for measuring the residual phase noise of a frequency divider is proposed. The new technique enables one divider to be characterised whereas the traditional technique necessitates two dividers. Experimentation demonstrates the validity of the technique, which is quicker and more…

Electronics Letters, 2000, 36 (16), pp.1391-1393. ⟨10.1049/el:20000983⟩. ⟨hal-00158126⟩

• Article dans une revue

Atomic force microscope tip-surface behaviour under continuous bias or pulsed voltages in non contact mode

Bernard Legrand, D. Stievenard

Applied Physics Letters, 2000, 76, pp.1018-1020. ⟨hal-00158646⟩

• Article dans une revue

Nature of impurity states in doped amorphous silicon

Guy Allan, Christophe Delerue, Michel Lannoo

We calculate the electronic structure of doped amorphous silicon in a tight-binding framework. Substitutional impurities are randomly introduced at fourfold-coordinated sites of a previously published model of a-Si:H. Our most important result is that single impurities have much larger binding…

Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2000, 61, pp.10206-10210. ⟨10.1103/PhysRevB.61.10206⟩. ⟨hal-00158663⟩