Publications
Affichage de 15511 à 15520 sur 16309
Theory of scanning tunneling microscopy of defects on semiconductors surfaces
X. de La Broïse, C. Delerue, M. Lannoo, B. Grandidier, D. Stievenard
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2000, 61, pp.2138-2145. ⟨hal-00158951⟩
Electronic structure and rectification properties of a molecular diode
Christophe Krzeminski, Christophe Delerue, Guy Allan, Dominique Vuillaume, Robert M Metzger
Asia-Pacific Surface and Interface Analysis Conference, APSIAC 2000, 2000, Beijing, China. ⟨hal-00158953⟩
A study of the formation of nano-domains in mixed alkylsiloxane self-assembled monolayers on silicon
Laurent Breuil, Dominique Vuillaume
Proceedings of the 9th International Conference on Organized Molecular Films, LB9, Aug 2000, Potsdam, Germany. ⟨hal-00158958⟩
Organisation et propriétés électroniques de monocouches d'alkylsiloxanes fonctionnalisées par des groupements conjugués
S. Lenfant, J. Collet, D. Vuillaume, A. Bouloussa, F. Rondelez, J. Gay, K. Kham, C. Chevrot
7èmes Journées de la Matière Condensée, 2000, Poitiers, France. ⟨hal-00158947⟩
Performance comparison of advanced receiver structures for dispersive DECT channels
M. Zaizouni, Jean-Michel Rouvaen, Atika Rivenq, F. Haine
Wireless Personal Communications, 2000, 15, pp.199-205. ⟨hal-00159055⟩
Analyses électromagnétiques des supports de propagation pour la microélectronique. Application à l'étude des circuits intégrés micro-ondes
Fabrice Huret
2000. ⟨hal-00158615⟩
Microwave optoelectronic components and systems
Didier Decoster
4th Seminar 'Nanostructures : Research, Technology and Applications', 2000, Bachotek, Poland. ⟨hal-00158620⟩
InP photodetectors for millimeter-wave applications
Didier Decoster, V. Magnin, Jean-Pierre Vilcot, Joseph Harari, J.P. Gouy, M. Fendler, F. Jorge
SPIE Photonics West - Optoelectronics, Photodetectors : Materials and Devices V, 2000, San José, CA, United States. ⟨hal-00158619⟩
Comparison between TiAl and TiAlNiAu ohmic contacts to n-type GaN
B. Boudart, S. Trassaert, X. Wallart, J.C. Pesant, O. Yaradou, D. Theron, Y. Crosnier, H. Lahreche, F. Omnes
Journal of Electronic Materials, 2000, 29, pp.603-606. ⟨hal-00158984⟩
Diagnosis of trapping phenomena in GaN MESFET's
G. Meneghesso, A. Chini, E. Zanoni, M. Manfredi, M. Pavesi, B. Boudart, Christophe Gaquière
2000, pp.389-392. ⟨hal-00159002⟩