Publications
Affichage de 15551 à 15560 sur 16175
Growth of strained Ga1-xInxP layers on GaP (001) by gas source molecular beam epitaxy : comparison with the GaInAs/GaAs system
X. Wallart, D. Deresmes, F. Mollot
2000, pp.231-234. ⟨hal-00158442⟩
Excitonic and quasiparticle gaps in Si nanocrystals
Christophe Delerue, Michel Lannoo, Guy Allan
CECAM Workshop on Excited States and Electronic Spectra, 2000, Lyon, France. ⟨10.1103/PhysRevLett.84.2457⟩. ⟨hal-00158952⟩
Charge control and electron transport properties in InAlAs/InGaAs metamorphic HEMT's : effect of indium content
Y. Cordier, M. Zaknoune, S. Bollaert, A. Cappy
2000, pp.102-105. ⟨hal-00159005⟩
AlGaInP barrier layer grown by gas source molecular beam epitaxy for V-band AlGaInP/InGaAs/GaAs power pseudomorphic HEMT
M. Zaknoune, O. Schuler, X. Wallart, S. Piotrowicz, F. Mollot, D. Theron, Y. Crosnier
2000, pp.353-356. ⟨hal-00159004⟩
STM studies of organic molecules on Si(100) : what can we learn ?
D. Stievenard
Research Conference on Manipulation of Individual Atoms and Molecules, 2000, Les Houches, France. ⟨hal-00158964⟩
Visualisation des ondes Ao, So, A1, S1 et A sur une plaque métallique immergée
L. Derbesse, Philippe Pernod, V. Latard, A. Merlen
2000, pp.92-94. ⟨hal-00158457⟩
Determination of the electrical properties of thermally grown ultrathin nitride films
N. Pic, A. Glachant, S. Nitsche, J.Y. Hoarau, D. Goguenheim, D. Vuillaume, A. Sibai, C. Chaneliere
Microelectronics Reliability, 2000, 40, pp.589-592. ⟨hal-00158478⟩
Spatial mapping of electroluminescence due to impact ionization effect in high electron mobility transistors
Christophe Gaquière, B. Boudart, P.A. Dhamlincourt
Applied Spectroscopy, 2000, 54, pp.1423-1428. ⟨hal-00158981⟩
Microsystème : enjeux et perspectives
D. Collard, L. Buchaillot, Bernard Legrand
Journée IMAPS : International Microelectronics and Packaging Society, 2000, Lille, France. ⟨hal-00158539⟩