Publications
Affichage de 15561 à 15570 sur 16109
Reduction of temporal busyness in low bit rate video coding
François-Xavier Coudoux, Marc G. Gazalet, Patrick Corlay
2000, pp.329-332. ⟨hal-00159054⟩
Detection of multiple signal echoes with a one bit correlator receiver
M. Saint-Venant, S. Mouty, Jamal Assaad, Fabrice Lefebvre, P. Deloof
2000, pp.196-201. ⟨hal-00159069⟩
Elaboration and characterization of PNZT thin films deposited on silicon by RF cathodic sputtering
T. Haccart, Eric Cattan, Denis Remiens
European Physical Journal: Applied Physics, 2000, 11, pp.103-106. ⟨10.1051/epjap:2000150⟩. ⟨hal-00158541⟩
Optimization of a low-frequency ultrasonic technique to monitor the change in physical states in viscoelastic media : gelation process
Georges Nassar, Bertrand Nongaillard, Y. Noël
Journal of the Acoustical Society of America, 2000, 107, pp.2735-2743. ⟨hal-00159073⟩
Contribution à la mise au point d'un dispositif de caractérisation ultrasonore du tissu osseux par ondes de Lamb
D.D. Ahite
2000. ⟨hal-00159066⟩
Elaboration et caractérisation physique par microscopie à champ proche de nanostructures semi-conductrices
Bernard Legrand
2000. ⟨hal-00158616⟩
Mechanisms of polariton stimulation in a microcavity
R. Andre, F. Boeuf, R. Romestain, S.L. Dang, Emmanuel Peronne, Jean-Francois Lampin, D. Hulin, Antigoni Alexandrou
Journal of Crystal Growth, 2000, 214-215, pp.1002-1009. ⟨hal-00158445⟩
Acoustic microscope based on magneto-elastic wave phase conjugator
Andrey Brysev, Leonid Krutyansky, Philippe Pernod, Vladimir Preobrazhensky
Applied Physics Letters, 2000, 76 (21), pp.3133-3135. ⟨10.1063/1.126547⟩. ⟨hal-00158450⟩
Giant magnetostriction (GMS) of TbFe monolayer with improved field-induced anisotropy and sensitivity
Henri Le Gall, Jamal Ben Youssef, J. Ostorero, Nicolas Tiercelin, Philippe Pernod, Vladimir Preobrazhensky
IEEE Transactions on Magnetics, 2000, 36 (5), pp.3223-3225. ⟨10.1109/20.908746⟩. ⟨hal-00158453⟩
Calibration of a two-dimensional numerical model for the optimization of LOCOS type isolations by response surface methodology
V. Senez, T. Hoffmann, A. Tixier
IEEE Transactions on Semiconductor Manufacturing, 2000, 13, pp.416-426. ⟨hal-00158511⟩